一种低电平工频电场探头的校准方法  

A Calibration Method for Low Level Power Frequency Electric Field Probe

作　　者：黎亮文 徐文娟 史云雷 邵鄂 李帅男 李宣毅 刘斌辉 LI Liang-wen;XU Wen-juan;SHI Yun-lei;SHAO E;LI Shuai-nan;LI Xuan-yi;LIU Bin-hui(CEPREI,Guangzhou 511370;Key Laboratory of MIIT for Intelligent Products Testing and Reliability,Guangzhou 511370)

机构地区：[1]工业和信息化部电子第五研究所,广州511370 [2]智能产品质量评价与可靠性保障技术工业和信息化部重点实验室,广州511370

出　　处：《环境技术》2022年第6期163-166,共4页Environmental Technology

基　　金：广东省重点领域研发计划,项目编号2020B0404020001。

摘　　要：校准工频电场探头时,受外部电力设备影响,工频电场环境噪声过高,导致工频电场探头无法测量低电平电场。针对低电平工频电场探头校准困难情况,本文利用信号发生器和GTEM小室搭建低电平工频电场探头校准系统,根据GTEM小室电场强度理论计算方式,提出一种低电平工频电场探头校准方法,并使用工频电场探头验证此校准方法,最后提出校准注意事项。Due to the influence of external power equipment, the noise of power frequency electric field is so high when calibrating the power frequency electric field probe that the probe cannot measure the low-level electric field. Aiming at the difficulty in calibrating low-level power-frequency electric field probes, this paper uses a signal generator and a GTEM cell to build a low-level power-frequency electric field probe calibration system, and proposes a low-level power-frequency electric field probe calibration method based on the theoretical calculation of the electric field strength in the GTEM cell, that is verified by using power frequency electric field probe. Finally, the calibration precautions are put forward.

关 键 词：工频电场 电场探头 GTEM小室 校准 

分 类 号：TN98[电子电信—信息与通信工程]