Two-color laser PEEM imaging of horizontal and vertical components of femtosecond surface plasmon polaritons  

作　　者：Zhen-Long Zhao Bo-Yu Ji Lun Wang Peng Lang Xiao-Wei Song Jing-Quan Lin 赵振龙;季博宇;王伦;郎鹏;宋晓伟;林景全(School of Physics,Changchun University of Science and Technology,Changchun 130022,China)

机构地区：[1]School of Physics,Changchun University of Science and Technology,Changchun 130022,China

出　　处：《Chinese Physics B》2022年第10期500-506,共7页中国物理B（英文版）

基　　金：Project supported by the National Natural Science Foundation of China (Grant Nos. 62005022, 12004052, and 62175018);the Fund from Jilin Provincial Key Laboratory of Ultrafast and Extreme Ultraviolet Optics (Grant No. YDZJ202102CXJD028);Department of Science and Technology of the Jilin Province, China (Grant Nos. 20200201268JC and 20200401052GX);the “111” Project of China (Grant No. D17017);the Fund from the Ministry of Education Key Laboratory for Cross-Scale Micro and Nano Manufacturing, Changchun University of Science and Technology。

摘　　要：Explicit visualization of different components of surface plasmon polaritons(SPPs) propagating at dielectric/metal interfaces is crucial in offering chances for the detailed design and control of the functionalities of plasmonic nanodevices in the future. Here, we reported independent imaging of the vertical and horizontal components of SPPs launched from a rectangular trench in the gold film by a 400-nm laser-assisted near-infrared(NIR) femtosecond laser time-resolved photoemission electron microscopy(TR-PEEM). The experiments demonstrate that distinct imaging of different components of SPPs field can be easily achieved by introducing the 400-nm laser. It can circumvent the risk of sample damage and information loss of excited SPPs field that is generally confronted in the usual NIR laser TR-PEEM scheme. The underlying mechanism for realizing distinct imaging of different components of the SPPs field with two-color PEEM is revealed via measuring the double logarithmic dependence of photoemission yield with the 800-nm and 400-nm pulse powers of different polarizations. Moreover, it is found that the PEEM image quality of the vertical and horizontal components of the SPPs field is nearly independent of the 400-nm pulse polarization. These results pave a way for SPPs-based applications and offer a possible solution for drawing a space-time field of SPPs in three dimensions.

关 键 词：femtosecond surface plasmon polaritons two-color photoemission electron microscopy near-field imaging 

分 类 号：TN249[电子电信—物理电子学] TP391.41[自动化与计算机技术—计算机应用技术]