薄膜铂电阻温度传感器多股线束渐次屈服与断裂失效分析  

Progressive yield and fracture failure analysis of the multi-strand wire in a platinum thin film resistance temperature detector

作　　者：钱诚 胡彩霞 孟津霄 李文娟 QIAN Cheng;HU Caixia;MENG Jinxiao;LI Wenjuan(Beihang University,Beijing 100191,China;Beijing Institute of Aerospace Automatic Control,Beijing 100854,China)

机构地区：[1]北京航空航天大学,北京100191 [2]北京航天自动控制研究所,北京100854

出　　处：《兵器装备工程学报》2022年第12期201-206,共6页Journal of Ordnance Equipment Engineering

基　　金：国家重点研发计划项目(2020YFB2009401)。

摘　　要：薄膜铂电阻温度传感器内部导线多为多股线束绞合结构,在尺寸、缠绕结构和材料性能等方面存在分散性,造成导线在拉伸状态下表现出渐次屈服和断裂过程,增加了失效分析的难度。鉴于上述情况,在本文中设计并开展了多股线束拉伸实验来分析多股线束的渐次屈服和断裂机制,试验结果表明屈服点位移所服从的概率分布为N(0.52,0.0212),断裂点位移所服从的概率分布为N(21.91,0.7512)。同时,多股线束屈服点力的均值仅为断裂点力均值的36.23%,屈服点位移均值仅为断裂点位移均值的2.38%,其表明多股线束较快地从弹性阶段进入了屈服阶段,且屈服阶段用时相对更长,反映了多股线束渐次屈服和渐次断裂的特点。研究成果将为后续开展温度传感器的可靠性设计与优化改进提供理论依据。The multi-strand wire usually has a twisting structure, in which dispersion exists in geometric dimensions, winding structure and material properties, leading to an obvious gradual yield and fracture process under tension, and, therefore, the difficulty of failure analysis increases. In view of this situation, this paper designs and carries out a batch of tensile tests on multi-strand wires to analyze the mechanism of gradual yield and fractures. The test results show that the yield point displacement follows a probability distribution N(0.52, 0.021~2), whereas the fracture point displacement follows a probability distribution N(21.91, 0.751~2). Meanwhile, the mean yield point force of the multi-strand wire is only 36.23% of the mean fracture point force, and the mean yield point displacement is only 2.38% of the mean fracture point displacement. This implies that the multi-strand wire quickly enters the yield stage from the elastic stage, and it takes a relatively longer time at the yield stage, which represents the characteristic of gradual yield and gradual fracture. The research results provide a theoretical basis for the reliability design and optimization of Pt RTDs in the future.

关 键 词：薄膜铂电阻温度传感器 多股线束 渐次屈服 渐次断裂 故障物理分析 

分 类 号：TM244[一般工业技术—材料科学与工程]