多波长消光法粒径测量下限影响因素分析  

Study on the lower limit of particle size distribution measurement by multi-wavelength extinction method

作　　者：吴文韬 周骛[1] 陈本廷 蔡小舒[1] WU Wentao;ZHOU Wu;CHEN Benting;CAI Xiaoshu(Institute of Particle and Two-phase Flow Measurement/Shanghai Key Laboratory of Multiphase Flow and Heat Transfer in Power Engineering,University of Shanghai for Science and Technology,Shanghai 200093,China)

机构地区：[1]上海理工大学颗粒与两相流测量研究所/上海市动力工程多相流动与传热重点实验室,上海200093

出　　处：《能源研究与信息》2022年第4期230-235,共6页Energy Research and Information

摘　　要：介绍了根据Lambert-Beer定理并采用多波长消光法测量颗粒粒径分布的方法。提出了基于数值模拟和数理统计对多波长消光法粒径测量下限进行估计的方法。通过数值模拟分析讨论了入射光波长、颗粒相对折射率和透光率对粒径测量下限的影响。研究为多波长消光法粒径测量在实际应用中的可行性提供了指导。The measurement method of particle size distribution by multi-wavelength extinction based on Lambert-Beer theorem was introduced.An approach for estimating the lower limit of particle size measurement by multi-wavelength extinction method in terms of numerical simulation and mathematical statistics was proposed.The influence of incident wavelength,relative refractive index of particles and light transmittance on the lower limit of measurement was analyzed and discussed via numerical simulation.It can provide guidance for the potential practical applications of particle size measurement by multi-wavelength extinction.

关 键 词：多波长消光法 MIE理论 粒径分布测量 测量下限 

分 类 号：TP392[自动化与计算机技术—计算机应用技术]