基于多波段光源的智能痕迹分色方法  

Intelligent trace color separation method based on multi-band light source

作　　者：高毅[1] 于瀛[2] 杨絮[3] 项双喜 GAO Yi;YU Ying;YANG Xu;XIANG Shuangxi(Key Laboratory of Trace Inspection and Identification Technology(Ministry of Public Security),Criminal Investigation Police University of China,Shenyang 110035,China;Key Laboratory of Optoelectronic Information Control and Security Technology,Tianjin 300308,China;School of Electronics and Information Engineering,Changchun University of Science and Technology,Changchun 130022,China)

机构地区：[1]中国刑事警察学院痕迹检验鉴定技术公安部重点实验室,辽宁沈阳110035 [2]光电信息控制和安全技术重点实验室,天津300308 [3]长春理工大学电子信息工程学院,吉林长春130022

出　　处：《应用光学》2023年第1期46-54,共9页Journal of Applied Optics

基　　金：公安部科技强警基础工作专项项目(GABJC04);辽宁省教育厅重大科研经费项目(ZGXJ2020002);吉林省科技厅社发项目(20220203043SF);法庭科学湖北省重点实验室(湖北警官学院)资助课题(KFKT2022002)。

摘　　要：针对常规分色摄影技术难以获得清晰可辨的图像信息和丰富的纹理特征,设计了一种基于多波段光源的痕迹分色摄影智能系统。通过STM32、LED、加色效应、互补色原理设计多波段光源模块,解决不同痕迹背景对应单色光的选择问题;通过混合式步进电机、DEV8825电机驱动模块和STM32,设计可上下、左右移动的光源模块,解决最佳配光位置的寻找问题;通过改进的FS-SIFT配准算法和引入二代Curvelet融合算法,设计两者相结合的图像处理系统,解决了常规摄影中痕迹提取与图像处理未同步的问题。实验结果表明,该系统摄影的痕迹图像,其背景与痕迹间的亮度反差更大,质量更好;经改进的FS-SIFT算法配准及二代Curvelet算法融合处理后,图像标准差平均提升1.25倍,信息熵平均提升1.70倍,平均梯度平均提升1.46倍,所得图像平均信息量和纹理特征更丰富。For the conventional color separation photography technology was difficult to obtain the clear image information and rich texture characteristics, a trace color separation photography intelligent system based on multi-band light source was designed. The multi-band light source module was designed by STM32, LED,additive color effect and complementary color principle to solve the problem of selecting monochromatic light corresponding to different trace backgrounds. The light source module that could be moved up and down, left and right was designed by hybrid stepper motor, DEV8825 motor driver module and STM32 to solve the problem of finding the best light distribution position. Through the improved FS-SIFT registration algorithm and the introduction of the second-generation Curvelet fusion algorithm, a combined image processing system was designed to solve the problem of unsynchronized trace extraction and image processing in conventional photography. The experimental results show that the brightness contrast between the background and the trace image photographed by the system is larger and the quality is better. After the improved FS-SIFT algorithm registration and the second-generation Curvelet algorithm fusion processing, the average standard deviation of the image is increased by 1.25 times, the average information entropy is increased by 1.70 times, the average gradient is increased by 1.46 times, and the average amount of information and texture features of the obtained image are richer.

关 键 词：痕迹物证 分色摄影 单色光源 最佳位置 FS-SIFT 二代Curvelet 

分 类 号：TN209[电子电信—物理电子学] TP391.4[自动化与计算机技术—计算机应用技术]