高低湿环境下酥朽复合绝缘子短样温升与热源仿真分析  

Simulation Analysis of Temperature Rise and Heat Source of Short Samples of Decay-like Composite Insulators in High and Low Ambient Humidity

作　　者：侯思祖[1] 钟正[2] 黄齐林 刘云鹏[2] 耿江海[2] HOU Sizu;ZHONG Zheng;HUANG Qilin;LIU Yunpeng;GENG Jianghai(Hebei Key Laboratory of Power Internet of Things Technology(North China Electric Power University),Baoding 071003,China;Hebei Provincial Key Laboratory of Power Transmission Equipment Security Defense(North China Electric Power University),Baoding 071003,China)

机构地区：[1]河北省电力网联网技术重点实验室(华北电力大学),河北保定071003 [2]河北省输变电安全防御重点实验室(华北电力大学),河北保定071003

出　　处：《华北电力大学学报（自然科学版）》2023年第1期9-17,共9页Journal of North China Electric Power University：Natural Science Edition

基　　金：国家重点研发计划项目(2018YFF01011900).

摘　　要：复合绝缘子由于其优异的抗污闪性能而被广泛应用于输电线路。基于酥朽复合绝缘子的温升情况通过红外成像技术及时筛查酥朽缺陷是保障电网安全运行的有效手段。但复杂运行工况下影响复合绝缘子温升的因素较多,如环境湿度,护套老化等。针对500 kV酥朽复合绝缘子上截取的两段典型短试样,建立护套老化及酥朽劣化短试样模型,通过有限元方法计算了高低湿环境下两试样温度及电流密度的分布情况,并分析了不同条件下引起试样温升的热源,最后通过试验验证了仿真模型的合理性和计算结果的正确性。仿真结果表明:低湿环境下,护套老化试样温升热源为护套老化层,酥朽试样温升热源为芯棒酥朽部分;高湿环境下,护套老化试样温升热源不变,而酥朽试样温升热源为芯棒-护套界面处的水分以及芯棒酥朽部分。结论对揭示不同劣化状态或缺陷类型下复合绝缘子温升特性及机理具有指导意义和重要参考价值。Composite insulators are widely used in transmission lines because of their excellent anti-pollution flashover performance.Based on the temperature rise of decay-like composite insulators,timely screening decay-like defects through infrared imaging technology is an effective way to ensure the safe operation of power grid.However,there are many factors affecting the temperature rise of composite insulators under complex operating conditions,such as environmental humidity,sheath aging and so on.The two typical short samples of 500 kV decay-like composite insulator was modeled,the distribution of temperature and current density of the two samples in high and low humidity environment were calculated by finite element method,and the heat source causing the sample temperature rise under different conditions was analyzed.Finally,the rationality of the simulation model and the correctness of the calculation results were verified by experiments.The simulation results show that in low humidity,heat source of sheath aging sample is the aging layer and that of crisp sample is the decay-like part of mandrel;in high humidity environment,heat source of sheath sample is the same while that of crisp sample are water at the interface between mandrel and sheath and the decay-like part of mandrel.The conclusions of this paper have guiding significance and important reference value for revealing the temperature rise characteristics and mechanism of composite insulators under different deterioration states or defect types.

关 键 词：复合绝缘子 酥朽 温升 热源 湿度 

分 类 号：TM726.1[电气工程—电力系统及自动化]