基于前向光散射的水体悬浮颗粒物粒度双CMOS测量技术研究  

Research on particle size of suspended particles in water measurement technology by Dual-CMOS based on forward light scattering

作　　者：漆艳菊 赵南京 张小玲 殷高方 石朝毅[3] 石一鸣 刘灯奎 贾仁庆 储震 QI Yanju;ZHAO Nanjing;ZHANG Xiaoling;YIN Gaofang;SHI Chaoyi;SHI Yiming;LIU Dengkui;JIA Renqing;CHU Zhen(Information Materials and Intelligent Sensing Laboratory of Anhui Province,Institutes of Physical Science and Information Technology,Anhui University,Hefei 230601,China;Key Laboratory of Environmental Optics and Technology,Anhui Institute of Optics and Fine Mechanics,Chinese Academy of Sciences,Hefei 230601,China;Hefei University,Hefei 230601,China;School of Environmental Science and Optoelectronic Technology,University of Science and Technology of China,Hefei 230026,China)

机构地区：[1]安徽大学物质科学与信息技术研究院安徽省信息材料与智能感知实验室,安徽合肥230601 [2]中国科学院安徽光学精密机械研究所中国科学院环境光学与技术重点实验室,安徽合肥230031 [3]合肥学院,安徽合肥230601 [4]中国科学技术大学环境科学与光电技术学院,安徽合肥230026

出　　处：《光学技术》2022年第6期696-702,共7页Optical Technique

基　　金：中国科学院科研仪器设备研制项目(YJKYYQ20190050);中国科学院环境光学与技术重点实验室开放基金(2005DP173065-2020-01);安徽省科技重大专项(202003a07020007);安徽省高校优秀青年人才支持计划项目(gxyq2021229)。

摘　　要：基于CMOS探测器的静态光散射法能够实现水体悬浮颗粒物粒度分布的快速检测,受探测器工作特性和面幅大小的限制,前向光散射的CMOS粒度测量范围和精度难以提高。提出了颗粒前向光散射的双CMOS测量技术,重点研究双CMOS散射信号拼接测量方法,设计消除背景干扰的CMOS探测器分环方式,实现宽粒径范围颗粒粒度的准确测量。实验结果表明:基于CMOS探测器的颗粒粒度测量上限提高到了1000μm,1000μm、500μm标样的D_(50)测量相对误差分别为0.7%、0.1%,大粒径颗粒粒度测量准确度高;同时双CMOS探测的方式将单CMOS的粒度测量下限由5μm提高到了2μm,5μm、2μm标样D_(50)相对误差分别由单CMOS的15.0%、51.1%下降至双CMOS的1.4%、2.6%。The rapid detection of particle size distribution of suspended particles in water can be realized by static light scattering method based on CMOS detector.However,the measurement range and accuracy of particle size based on forward light scattering method were difficult to improve,which was limited by the working characteristics of the CMOS detector and the size of the screen.Therefore,a multi CMOS measurement technology for particle forward light scattering was proposed,focusing on the splicing measurement method of dual CMOS scattering signals,and a CMOS detector ringsplitting method to eliminate background interference was designed to achieve accurate measurement of particle size in a wide particle size range.The results show that the upper limit of particle size measurement based on CMOS detector is increased to 1000μm,and the relative error of D50measurement of 1000μm and 500μm standard samples is 0.7% and0.1% respectively,and the measurement accuracy of large particle size particle size is high;The method of double CMOS detection increases the particle size measurement limit of single CMOS from 5μm to 2μm.the relative error of D50of 5μm and 2μm standard samples decreased from 15.0% and 51.1% of single CMOS to 1.4% and 2.6% of double CMOS respectively.

关 键 词：粒度测量 MIE散射理论 CMOS图像传感器 图像处理 

分 类 号：TH741[机械工程—光学工程]