脑皮质突触结构透射电镜统计方法的探索  

Exploration of transmission electron microscopic statistical method for synaptic structure of cerebral cortex

作　　者：杨洋 王贤哲 张文静 毕研哲 杨波 李峥 毕爱玲[2] 陈哲宇[3] 李伯勤 YANG Yang;WANG Xian-zhe;ZHANG Wen-jing;BI Yan-zhe;YANG Bo;LI Zheng;BI Ai-ling;CHEN Zhe-yu;LI Bo-qin(Ultrastructure Laboratory of Shandong Weiya Biotechnology Co.Ltd.,Jinan Shandong 250000;Eye Institute of Shandong University of Traditional Chinese Medicine,Jinan Shandong 250004;Medical College of Shandong University,Jinan Shandong 250012,China)

机构地区：[1]山东微亚生物科技有限公司超微结构实验室,山东济南250000 [2]山东中医药大学附属眼科医院,山东济南250004 [3]山东大学医学院,山东济南250012

出　　处：《电子显微学报》2023年第1期75-79,共5页Journal of Chinese Electron Microscopy Society

摘　　要：利用透射电镜(TEM)对神经突触结构进行统计学分析,虽然在近年来的神经科学研究中已被一些学者使用,但由于脑组织TEM样品较小,突触结构涉及亚细胞统计学,所以如何设计统计源,以保证其具有代表性与客观性是至关重要的问题,至今仍未建立成熟一致的标准。本文针对大鼠特定脑区,采用“三级定位法”,建立了一种突触结构的TEM统计分析方法,简单并具有客观性,被应用于多项神经生物学研究。该方法可为动物行为学、电生理学和神经分子生物学实验提供客观的亚细胞统计学佐证,可为相关研究提供参考方法。The statistical analysis of synaptic structure by transmission electron microscopy(TEM) has been used by some scholars in neuroscience research in recent years. However, due to the small TEM samples of brain tissue and the involvement of subcellular statistics in synaptic structure, how to design statistical sources to ensure their representativeness and objectivity is a crucial problem, and a mature and consistent standard has not been established so far. In this paper, a TEM statistical analysis method of synaptic structure is established by using “three-level localization method” for specific brain regions of rats. It is simple and objective, and has been applied to a number of neurobiological studies. This method can provide objective subcellular statistical evidence for animal behavior, electrophysiology and neuromolecular biology experiments, and is suitable for popularization.

关 键 词：脑组织 突触 透射电镜 统计分析 

分 类 号：Q336[生物学—遗传学]