芯片样品验证平台自适应和同步测试功能的设计与实现  

Design and implementation of adaptive and synchronous test function of chip sample verification platform

作　　者：徐靖林 王栋 魏斌 王赟 窦志军 成嵩 Xu Jinglin;Wang Dong;Wei Bin;Wang Yun;Dou Zhijun;Cheng Song(Beijing Smart-Chip Microelectronics Technology Co.,Ltd.,Beijing 100192,China)

机构地区：[1]北京智芯微电子科技有限公司,北京100192

出　　处：《电子技术应用》2023年第2期55-60,共6页Application of Electronic Technique

摘　　要：目前,芯片设计公司在对量产级的芯片进行样品验证时,传统的样品验证方法大多是基于芯片自身特点来设计相应的测试设备,然后通过测试夹具对芯片样品逐一测试,不同的芯片会设计不同的测试设备。提出了一种自适应且可同步测试的样品验证平台方案,既可以实现同时测试多颗芯片,也可以对不同接口的芯片进行测试;既可以进行可靠性实验测试,也可以进行其他功能的测试,大大节省了测试设备的维护成本,提高测试效率。At present,in chip design companies,sample verification is carried out for mass production chips.Most of the tradi‐tional sample verification methods design corresponding test equipment based on the characteristics of the chip,and then test the chip samples one by one through the test fixture.Different chips will design different test equipment.In this paper,an adaptive and synchronous test sample verification platform scheme is proposed,which can not only test multiple chips at the same time,but also test chips with different interfaces.It can not only test the reliability experiment,but also test other functions,which greatly saves the maintenance cost of test equipment and improves the test efficiency.

关 键 词：自适应 同步测试 样品验证 测试平台 

分 类 号：TN06[电子电信—物理电子学]