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作 者:A.PANDEY J.MIN Y.MALHOTRA M.REDDEPPA Y.XIAO Y.WU Z.MI
出 处:《Photonics Research》2022年第12期2809-2815,共7页光子学研究(英文版)
基 金:NS Nanotech,Inc.
摘 要:The absence of efficient red-emitting micrometer-scale light emitting diodes(LEDs),i.e.,LEDs with lateral dimensions of 1μm or less is a major barrier to the adoption of microLEDs in virtual/augmented reality.The underlying challenges include the presence of extensive defects and dislocations for indium-rich InGaN quantum wells,strain-induced quantum-confined Stark effect,and etch-induced surface damage during the fabrication of quantum well microLEDs.Here,we demonstrate a new approach to achieve strong red emission(>620 nm)from dislocation-free N-polar InGaN/GaN nanowires that included an InGaN/GaN short-period superlattice underneath the active region to relax strain and incorporate more indium within the InGaN dot active region.The resulting submicrometer-scale devices show red electroluminescence dominantly from an InGaN dot active region at low-to-moderate injection currents.A peak external quantum efficiency and a wall-plug efficiency of 2.2%and1.7%were measured,respectively,which,to the best of our knowledge,are the highest values reported for a submicrometer-scale red LED.This study offers a new path to overcome the efficiency bottleneck of red-emitting microLEDs for a broad range of applications including mobile displays,wearable electronics,biomedical sensing,ultrahigh speed optical interconnect,and virtual/augmented reality.
分 类 号:TN312.8[电子电信—物理电子学]
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