Effects of electron-and hole-current hysteresis on trap characterization in organo-inorganic halide perovskite  

作　　者：Fan Wu Sally Mabrouk Miaomiao Han Yanhua Tong Tiansheng Zhang Yuchen Zhang Raja Sekhar Bobba Quinn Qiao 

机构地区：[1]School of Science and Huzhou Key Lab of Materials for Energy Conversion and Storage,Huzhou University,Huzhou 313000,Zhejiang,China [2]Mechanical and Aerospace Engineering,Syracuse University,Syracuse,NY13244,United States

出　　处：《Journal of Energy Chemistry》2023年第1期414-420,I0010,共8页能源化学（英文版）

基　　金：supported in part by the National Natural Science Foundation of China(62004068;21607041;12147219);the Zhejiang Provincial Natural Science Foundation of China(Y20F040001);the Natural Science Foundation of Huzhou City,China(2019YZ02);the Syracuse University Startup Fund;the U.S.-Egypt Science and Technology(S&T)Joint Fund。

摘　　要：Charge trap density and carrier mobility of perovskite materials are the critical properties of perovskite solar cells.The space charge limited current(SCLC)method,which measures a dark current–voltage(I-V)curve of a single-carrier device has found extensive use for studying the trap density and charge carrier mobility in perovskite materials.Herein,it was found that the electron-and hole-current in organo-lead perovskite-based single-carrier device undergoes significant hysteresis under forward and reverse scanning due to the mobile ions.In addition,it was also observed that measuring history has a detrimental effect on hysteresis resulting in possible overestimation or underestimation of the extracted electrical values from the SCLC measurement.In the forward/reverse scanning process,the mobile ionic defects enhance/shield the charge in the traps due to ionic charging/discharging,thereby increasing/reducing the interface barrier and net charge in the I-V scanning,which in turn affects the determination of transport properties of the carrier.These results raise quite a few doubts over the direct application of classical SCLC measurements for the accurate characterization of intrinsic transport properties of the mixed ionicelectronic perovskite.

关 键 词：Organo-lead perovskite Ionic defects Space-charge-limited-current Trap density Mobility 

分 类 号：TB302[一般工业技术—材料科学与工程]