基于高加速应力筛选的电子产品筛选剖面研究  

Research on Screening Profile of Electronic Devices Based on Highly Accelerated Stress Screening

作　　者：诸戈 汤杰 漆斌 郭森 姚永超 ZHU Ge;TANG Jie;QI Bin;GUO Sen;YAO Yongchao(Shanghai Electro-Mechanical Engineering Institute,Shanghai 201109,China;Shanghai Spaceflight Precision Machinery Research Institute,Shanghai 201600,China)

机构地区：[1]上海机电工程研究所,上海201109 [2]上海航天精密机械研究所,上海201600

出　　处：《空天防御》2023年第1期17-22,37,共7页Air & Space Defense

基　　金：国防基础科研计划(JCKY2016203C009)。

摘　　要：为了提升产品和工艺设计的质量,主要是为消除初期产品的失效率从而提高其平均无故障时间,进一步地节约产品成本,基于高加速应力筛选的剖面设计理论要求,针对电子产品通过具体失效分析和试验剖面设计优化,给出电子产品高加速应力筛选的一般性筛选剖面条件,可以作为各电子产品进行高加速应力筛选的参考依据,提升其筛选试验效率。In order to improve the quality of products and process design,this paper mainly aims to eliminate the failure rate of initial products,improve their mean time between failures and further save product costs.Based on the theoretical requirements of HASS profile design,the paper presents the general screening profile conditions for electronic product HASS screening through specific failure analysis and test profile design optimization,which could be used as a reference for the HASS of electronic products and improve the screening test efficiency.

关 键 词：高加速应力筛选 电子产品 筛选剖面 

分 类 号：TN06[电子电信—物理电子学]