14.4 keV迈克耳孙X射线干涉仪设计及核心器件表征  

14.4 keV X-Ray Michelson Interferometer Design and Core Component Characterization

作　　者：司尚禹 李中亮 薛莲 杨俊亮 罗红心 李伟[3] 张小威[2] Si Shangyu;Li Zhongliang;Xue Lian;Yang Junliang;Luo Hongxin;Li Wei;Zhang Xiaowei(Shanghai Synchrotron Radiation Facility,Shanghai Advanced Research Institute,Chinese Academy of Sciences,Shanghai 201204,China;Multi-Disciplinary Research Division,Institute of High Energy Physics,China Academy of Sciences,Beijing 100049,China;Center for Advanced Measurement Science,National Institute of Metrology,Beijing 100029,China)

机构地区：[1]中国科学院上海高等研究院上海光源中心,上海201204 [2]中国科学院高能物理研究所多学科中心,北京100049 [3]中国计量科学研究院前沿计量科学中心,北京100029

出　　处：《光学学报》2023年第4期240-246,共7页Acta Optica Sinica

基　　金：国家自然科学基金面上项目(11975259);中国科学院青年促进会项目(2018297)。

摘　　要：介绍了一种全新的迈克耳孙X射线干涉仪设计,可用于57Fe穆斯堡尔14.4 keV核共振波长超精准测量。所设计结构是由反对称的三次劳厄衍射型(LLL)的X射线干涉仪和可以匹配14.4 keV波长的一体型双通道切槽单色器(MDCM)构成。在上海同步辐射光源利用14.4 keV单色光对国内首个自制LLL干涉仪的性能和MDCM的工况进行了在线测量和定量表征,得到了干涉仪条纹对比度的测量结果(0.37~0.63)和MDCM光学元件的修正参数。该研究为国内复杂构型X射线光学元件的研制和在线表征积累了技术经验。Objective The development of synchrotron radiation(SR)technology has made a qualitative breakthrough in the luminance of Mössburger sources.However,the traditional method based on the silicon lattice constant is still adopted in the experiment of wavelength measurement,and the measurement accuracy is affected by the uncertainty of the silicon lattice(2×10^(−8)).Since Bonse and Hart published their experimental results in 1965,the X-ray interferometer has been widely used for precision measurement of parameters,such as lattice constants,due to its extremely high accuracy.This interferometer technology can be used for accurate measurement of silicon lattice constants independent of X-ray wavelength values.The first report on the X-ray Michelson interferometer came from Appel and Bonse in 1991,who added a group of single channel-cut diffraction devices with adjustable optical paths into the space of the Laue-Laue-Laue(LLL)interferometer to form the structure of the interferometer.However,the Michelson interferometer based on this structure is not suitable for measuring the Mössburger resonance wavelength at which its operating wavelength is not around 14.4 keV,and the adjustable range is limited(a few micrometers)as the optical path difference in the interferometer is formed by the rotation of the optical components,which can hardly achieve high-precision measurement.We design an X-ray Michelson interferometer,which can be used to measure 14.4 keV Mössburger resonance wavelength.The LLL-interferometer and the monolithic double channel-cut monochromator(MDCM)that can accurately measure the optical path difference are fabricated.The key parameters such as the fringe contrast of the LLLinterferometer,diffraction bandwidth of MDCM,and relative displacement of the exit-beam position are measured online,which provides a technical basis and device foundation for the subsequent integration test of the Michelson interferometer.Methods The new design of the X-ray Michelson interferometer is shown in Fig.1.The non-disper

关 键 词：X射线光学 穆斯堡尔波长 迈克耳孙X射线干涉仪 三次劳厄衍射型干涉仪 一体型双通道切槽单色器 

分 类 号：O434[机械工程—光学工程]