低压成套开关设备内部电弧故障的试验技术  

Test Technology for Internal Arc Fault of Low-voltage Switchgear

作　　者：蔡晓玮 CAI Xiaowei(Shanghai Electrical Apparatus Research Institute(Group)Co.,Ltd.,Shanghai,200063 China)

机构地区：[1]上海电器科学研究所(集团)有限公司,上海200063

出　　处：《科技资讯》2023年第1期53-56,共4页Science & Technology Information

摘　　要：低压成套开关设备在整个电力系统中主要负责对低压配电系统进行控制、保护、监测,低压成套开关设备覆盖面极广,该文介绍了电气设备发生电弧故障的发生机理,通过分析低压成套开关设备的寿命预测,解决发生故障所存在的“过剩维修”问题。结合《封闭式低压成套开关设备和控制设备在内部故障电弧情况下得试验导则》,对低压成套开关设备的内部电弧故障展开试验研究,并对试验结果进行分析。Low-voltage switchgear is mainly responsible for the control,protection and monitoring of the lowvoltage distribution system in the whole power system,which covers a wide range of areas.This paper introduces the occurrence mechanism of arc fault in electrical equipment,and solves the problem of"excess maintenance"by analyzing the life prediction of the low-voltage switchgear.Combined with the Test Guide for Enclosed LowVoltage Switchgear and Control Equipment under Internal Fault Arc,the internal arc fault of low-voltage switchgear is tested and studied,and the test results are analyzed.

关 键 词：低压成套开关设备 内部电弧 寿命预测 引弧试验 

分 类 号：TM73[电气工程—电力系统及自动化]