原位变温X射线衍射测试技术及其影响因素  

In-Situ Variable Temperature X-Ray Diffraction Testing Technology and Its Effecting Factors

作　　者：毛晶[1] 郭倩颖[1] 马利利 龙丽霞[1] 韩雅静[1] 马晓晖 MAO Jing;GUO Qianying;MA Lii;LONG Lixia;HAN Yajing;MA Xiaohui(Material Science and Engineering School of Tianjin University,Tianjin 300350,China)

机构地区：[1]天津大学材料科学与工程学院,天津300350

出　　处：《分析测试技术与仪器》2023年第1期111-116,共6页Analysis and Testing Technology and Instruments

基　　金：天津大学校级教改项目“材料学科大型仪器平台原位测试系统的开发”(LAB2021-23)。

摘　　要：在X射线衍射仪中引入加热台,可以实现原位变温X射线衍射分析.原位试验是研究材料在加热或冷却过程中材料动力学的有效手段.对变温X射线衍射测试样品的要求、测量方法的原理、布鲁克D8 advance衍射仪原位变温的测试步骤以及测试过程中样品的收缩问题、背底衍射峰干扰等常见影响因素进行了详细的说明,为变温X射线衍射测试提供了具体的试验指导.By introducing a heating platform into the X-ray diffractometer,the in-situ variable temperature X-ray diffraction analysis can be achieved.The in-situ experiment is an effective means to study the dynamics of materials during the heating or cooling of materials.The requirements for variable temperature X-ray diffraction test samples,the principle of the measurement method,the test procedures for the Bruker D8 advance diffractometer with in-situ variable temperature were explored,and several problems that are frequently occur in the test process such as the shrinkage of samples during heating process,and interference of the diffraction peaks from substrate were described in detail.The method provides a specific experimental guidance for the high temperature X-ray diffraction testing.

关 键 词：原位变温X射线衍射 样品体积收缩 背底干扰 

分 类 号：O657[理学—分析化学]