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作 者:郝玉红[1] 周莹[1] 胡玲[1] 吴立敏[1] Hao Yuhong;Zhou Ying;Hu Ling;Wu Limin(Shanghai Institute of Measurement and Test Technology)
机构地区:[1]上海市计量测试技术研究院
出 处:《上海计量测试》2022年第6期2-3,12,共3页Shanghai Measurement and Testing
基 金:上海市质量技术监督局科技计划项目(2015-5)。
摘 要:研究制备出了宽分布激光衍射用固体颗粒度标准物质,填补了国内宽分布固体颗粒度标准物质的空白。采用高分辨力的扫描电子显微镜(SEM)绝对测量法对标准物质进行定值,标准值可溯源至国家长度基准。定值结果为D_(50)=41.5μm,扩展不确定度为1.76%(k=2)。采用单因素方差分析法和t检验法检验了样品的均匀性和稳定性。定值过程和均匀性、稳定性都符合国家级标准物质的要求。A particle size reference material for wide distribution laser diffraction was studied,which filled the gaps in the domestic standard particle size.The standard material was determined by scanning electron microscopy(SEM),which was calibrated with Nist Standard Reference Material.It is shown that the sizes of this reference material are 41.5μm and the expanded uncertainty is 1.76%(k=2).The homogeneity and stability of samples were tested by one-way ANOVA and t test.The process of determining the value and uniformity and stability are in line with the requirements of the national grade particle size standards.
分 类 号:TN249[电子电信—物理电子学]
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