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作 者:边武 李仲启 梁琼崇[2] 廖开宇 张新定[1] 颜辉[1] BIAN Wu;LI Zhong-qi;LIANG Qiong-chong;LIAO Kai-yu;ZHANG Xin-ding;YAN Hui(School of Physics and Telecommunications Engineering,South China Normal University,Guangzhou 510006;The Fifth Electronic Research Institute,Ministry of Industry and Information Technology of the People’s Republic of China,Guangzhou 510570)
机构地区:[1]华南师范大学物理与电信工程学院,广州510006 [2]工业和信息化部电子第五研究所,广州510570
出 处:《导航与控制》2022年第5期185-191,79,共8页Navigation and Control
基 金:国家自然科学基金(编号:61875060)。
摘 要:基于里德堡原子的微波场强测量可基于量子效应接收和测量微波电场,被认为在微波场强计量领域具备实用化潜力。通过对激光器、激光光路、室温铯原子天线等组件的定制与优化,制作了集成式原子微波场强仪。在微波暗室中,将基于该集成设备的测量方法及结果与现有计量体系下的微波场强计量标准,即标准场及标准场探头方法的结果进行比对。在3.10GHz点频上的比对结果为:1)高功率(4.17V/m~14.85V/m)下,重复性为0.44%~0.71%,非线性度为3.8%,比对误差为-2.61%~3.31%;2)低功率(2.00V/m~4.69V/m)下,重复性为0.28%~0.80%,非线性度为1.7%,比对误差为-5.08%~4.30%。结果表明,该原子微波场强仪的测试结果与现有标准场法测量结果吻合,而在重复性等指标上表现更优。The microwave field strength measurement method based on Rydberg atom can receive and measure the microwave electric field strength based on quantum effect,and is considered to have practical potential in the field of microwave field strength meterage.Through the customization and optimization of components such as lasers,laser optical paths,and room temperature cesium atomic antennas,an integrated atomic microwave field strength meter is fabricated.In the microwave anechoic chamber,the measurement methods and results of this integrated equipment with the microwave field strength measurement standard under the existing measurement system are compared,namely the standard field and the standard field probe method.The comparison results at the 3.10GHz point frequency are:Under high power(4.17V/m~14.85V/m),the repeatability is 0.44%~0.71%,the nonlinearity is 3.8%,the comparison error is-2.61%~3.31%.Under low power(2.00V/m~4.69V/m),the repeatability is 0.28%~0.80%,nonlinearity is 1.7%,the comparison error is-5.08%~4.30%.The results show that the test results of the atomic microwave field strength meter are consistent with the measurement results of the existing standard field method,and the performance is better in repeatability and other indicators.
分 类 号:O562.32[理学—原子与分子物理]
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