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作 者:赵慧洁[1,2] 李宇曦 姜宏志 李旭东[1,2] Zhao Huijie;Li Yuxi;Jiang Hongzhi;Li Xudong(School of Instrumentation and Optoelectronic Engineering,Beihang University,Beijing 100191,China;Beihang University Qingdao Research Institute,Qingdao 266101,Shandong,China)
机构地区:[1]北京航空航天大学仪器科学与光电工程学院,北京100191 [2]北京航空航天大学青岛研究院,山东青岛266101
出 处:《激光与光电子学进展》2023年第8期268-279,共12页Laser & Optoelectronics Progress
基 金:国家重点研发计划项目(2020YFB2010701);国家自然科学基金(61875007,61735003)。
摘 要:现代工业零部件的加工已经实现了无需二维标注图纸,由计算机辅助设计3D模型直接输入数控系统加工。加工工艺的进步给工件测量和质量评价方法带来了新挑战,通过获取零部件的高精度稠密三维点云的“靠模”质量评价方法得到了重视,特别是对于结构复杂的零部件。然而,高精度复杂结构的零部件三维测量遇到两个难题:1)金属零部件加工后表面光洁度很高,主动投射的条纹光束会引起金属表面的强烈反光致盲或者复杂结构引起的投射光多次反光混叠;2)复合材料的半透明会引起投射光的次表面散射。这些因素都会导致测量失效。现有结构光主动视觉三维重构技术无法解决上述难题。针对复杂型面免喷涂三维重构问题,建立基于单像素成像方法的复杂光照分离模型,实现直接光与复杂光照分离。为了解决单像素成像方法效率低、速度慢、难以满足工业现场测量需求的问题,提出一种基于局部区域延拓的并行单像素成像方法。实验结果表明,并行单像素成像方法能够很好地实现工业测量现场多次反光与次表面散射光干扰条件下的三维重构。The processing of modern industrial parts has realized the technology for directly inputting 3D computer-aided design models into numerical control systems without the need for two-dimensional marking blueprints.The advancement of processing technology has introduced new challenges to workpiece measurement and quality evaluation methods.The profile modeling quality evaluation method based on obtaining high-precision and dense 3D point cloud models of workpieces has received attention,particularly for the manufacturing of parts with complex structures.However,the highprecision 3D measurement of parts with complex structures presents two challenges.The first is the very high surface finish of metal parts after processing.Actively projected patterns cause strong reflections on the metal surface,resulting in the problem of blindness or interreflections between complex structures,the latter of which results in aliasing.The second is the subsurface scattering of projected light owing to the translucency of composite materials.These factors induce measurement failure.The existing structured light-active vision 3D reconstruction technology cannot solve the aforementioned problems.Thus,a complex light separation model based on a single-pixel imaging method is established to address the problem of 3D reconstruction under complex illumination without spraying.This method realizes the separation of direct and complex illumination and resolves the aforementioned difficulties.To tackle the problems faced by the single-pixel imaging method,including low efficiency,speed,and its practicability in real-world measurement scenarios,a parallel single-pixel imaging method based on a local region extension method is proposed.Experiments demonstrate that the parallel single-pixel imaging method can solve the problem of 3D reconstruction under the influence of interreflections and subsurface scattering that may occur in practical measurement situations.
关 键 词:成像系统 单像素成像 多次反光 次表面散射 三维测量
分 类 号:TP391.41[自动化与计算机技术—计算机应用技术]
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