Direct high-resolution X-ray imaging exploiting pseudorandomness  

作　　者：KyeoReh Lee Jun Lim Su Yong Lee YongKeun Park 

机构地区：[1]Department of Physics,Korea Advanced Institute of Science and Technology,Daejeon 34141,Republic of Korea [2]KAIST Institute for Health Science and Technology,Korea Advanced Institute of Science and Technology,Daejeon 34141,Republic of Korea [3]Pohang Accelerator Laboratory,Pohang University of Science and Technology,Pohang,Kyungbuk 37637,Republic of Korea [4]Tomocube Inc,Daejeon 34051,Republic of Korea

出　　处：《Light(Science & Applications)》2023年第5期776-788,共13页光（科学与应用)（英文版）

基　　金：supported by the Tomocube,KAIST Advanced Institute for Science-X,National Research Foundation of Korea(2015R1A3A2066550,2021R1C1C2009220,2022M3H4A1A02074314);an Institute of Information&Communications Technology Planning&Evaluation(IITP)grant funded by the Korean government(MSIT)(2021-0-00745);Technology Innovation program(20011661)funded by the Ministry of Trade,Industry&Energy(MOTIE);supported in part by MSIT and POSTECH.

摘　　要：Owing to its unique penetrating power and high-resolution capability,X-ray imaging has been an irreplaceable tool since its discovery.Despite the significance,the resolution of X-ray imaging has largely been limited by the technical difficulties on X-ray lens making.Various lensless imaging methods have been proposed,but are yet relying on multiple measurements or additional constraints on measurements or samples.Here we present coherent specklecorrelation imaging(CSI)using a designed X-ray diffuser.CSI has no prerequisites for samples or measurements.Instead,from a single shot measurement,the complex sample field is retrieved based on the pseudorandomness of the speckle intensity pattern,ensured through a diffuser.We achieve a spatial resolution of 13.9 nm at 5.46 keV,beating the feature size of the diffuser used(300 nm).The high-resolution imaging capability is theoretically explained based on fundamental and practical limits.We expect the CSI to be a versatile tool for navigating the unexplored world of nanometer.

关 键 词：RESOLUTION SPECKLE replace 

分 类 号：O43[机械工程—光学工程]