波片延迟量在0°~360°的高精度测量方法研究  

High-precision Measurement Methods Research of Phase Retardance of Waveplates at 0°~360°

作　　者：万凡 钟悦[1] 屈中权[1] 徐稚[1] 张辉 彭洋 WAN Fan;ZHONG Yue;QU Zhongquan;XU Zhi;ZHANG Hui;PENG Yang(Yunnan Observatories,Chinese Academy of Sciences,Kunming 650217,China;University of Chinese Academy of Sciences,Beijing 100049,China)

机构地区：[1]中国科学院云南天文台,昆明650216 [2]中国科学院大学,北京100049

出　　处：《光子学报》2023年第5期197-211,共15页Acta Photonica Sinica

基　　金：国家自然科学基金(Nos.11527804,E011140301,11873091,12003066);中国科学院任务/院科研装备研制项目(No.Y9CZ051001);云南省基础研究计划(No.2019FA001)。

摘　　要：为了精确测量非消色差波片的延迟量与快轴方位角,基于拟合光强法与光谱分析法建立了一套高精度测量系统,实现了特定波长下非消色差波片延迟量在0°~360°的高精度测量。对波片延迟量的测量方法及误差来源进行了详细的模拟分析。在拟合光强法下,重点仿真了光源光强抖动变化、检偏器初始安装精度、旋转波片定位精度等随机误差与各项系统误差对测量精度的影响,详细分析了拟合光强法不能精确测量波片延迟量为180°的原因。在光谱分析法下模拟了光源光强抖动变化、光谱的单色精度、检偏器定位精度引入的测量误差。在测量系统的建立中对上述两种测量方法影响较大的误差均进行了抑制,并对探测器的光电响应非线性效应进行了矫正。最后利用该测量系统对标称的λ/4波片、0.356λ波片、λ/2波片进行了相关实测并利用非线性最小二乘法对测量数据进行处理,获得了参考波长在632.8 nm的各波片的相位延迟量与快轴方位角。由该测量系统的实测结果可知:本文采用的拟合光强法测量λ/4波片、0.356λ波片延迟量的测量误差小于0.05°,测量精度比传统光强测量法高一个数量级以上。对于λ/2非消色差波片,在该测量系统下切换终端光强接受设备并采用光谱分析法对其进行测量,测得其延迟量误差小于0.02°,远小于拟合光强法的测量误差0.70°,克服了光强法无法精确测量波片延迟量为180°的缺陷。实测结果与模拟仿真相符。To measure the phase retardance and the fast-axis position angel of non-achromatic waveplates accurately,a high-precision measurement system is established based on the fitting light intensity method and spectral analysis method,which can realize the high-precision measurement of the retardance of nonachromatic waveplates at 0°~360°.The measuring system is composed of a white light source,an aperture diaphragm,a narrow band filter,a Glan Taylor prism as polarization generator,a non-achromatic waveplate to be measured,a Glan Taylor prism as polarization analyzer,an optical power meter or spectrometer.When the phase retardance and the fast-axis position angel of non-achromatic waveplates are measured by the fitting light intensity method,the white light emitted by the white light source is collimated parallel by the collimating system,then it passes through an aperture diaphragm,a narrow filter and a polarization generator,which is modulated into monochromatic linearly polarized light.Next the linearly polarized light goes through the waveplates and the polarization analyzer,is finally received by the optical power meter.During the whole measuring process,the high precision motor drives non-achromatic waveplates that are to be measured to rotate uniformly.However,in the measurement process of spectral analysis measuring method,it is necessary to move the narrow filter out of the optical measurement path,and replace the power meter with the spectrometer as the terminal detection device,in this case,nonachromatic waveplates are not needed to rotate by the motor.Before the formal measurement of the retardance and the initial fast-axis position angle of waveplates,the stability of the measurement system and the sources of measurement errors are analyzed in detail in this paper.Under the light intensity measurement method,the influence of random errors such as light source intensity jetter,the initial fastaxis position angle and the rotating position angle of the rotating waveplate and some system errors like nonlinea

关 键 词：测量 高精度 波片 相位延迟 方位角 误差分析 最小二乘法 

分 类 号：O436.3[机械工程—光学工程]