纵波双晶直探头检测中厚钢板近表面缺陷的试验研究  

Experimental Study on the Detection of Near Surface Defects in Medium and Heavy Steel Plates Using Longitudinal Wave Double Crystal Straight Probes

作　　者：李军 马晓生 Li Jun;Ma Xiaosheng(Baowu Group Shanxi Headquarters Taigang Stainless Steel Co.,Ltd.,Taiyuan Shanxi 030003)

机构地区：[1]宝武集团山西总部太钢不锈钢股份有限公司,山西太原030003

出　　处：《山西冶金》2023年第4期11-14,共4页Shanxi Metallurgy

摘　　要：中厚钢板的超声检测常采用纵波双晶直探头,根据双晶直探头原理,阐述焦距的选择原则,针对双晶直探头检测钢板近表面缺陷的能力进行试验和分析。试验结果表明:随着焦距的增加,双晶直探头对近表面缺陷的检测灵敏度逐渐降低;焦距为5~10 mm的双晶直探头有利于检测近表面缺陷。因此,为实现中厚板全体积检测,应选用两种不同焦距的双晶探头相互补充。Longitudinal wave double crystal straight probes are often used for ultrasonic testing of medium and thick steel plates.According to the principle of double crystal straight probes,the selection principle of focal length is elaborated,and the ability of double crystal straight probes to detect near-surface defects of steel plates is tested and analyzed.The experimental results show that with the increase of focal length,the sensitivity of the dual crystal straight probe to detect near surface defects gradually decreases.A dual crystal straight probe with a focal length of 5~10 mm is beneficial for detecting near surface defects.Therefore,in order to achieve full volume detection of medium and thick plates,two types of dual crystal probes with different focal lengths should be selected to complement each other.

关 键 词：中厚钢板 双晶直探头 焦距 近表面缺陷 

分 类 号：TG245[金属学及工艺—铸造]