一种用于智能功率器件的直接结温测量系统  

A Down-to-junction Temperature Measurement System for Smart Power Devices

作　　者：杨睿煊 杨世红 孔垂凯 李丹[1] YANG Rui-xuan;YANG Shi-hong;KONG Chui-kai;LI Dan(Xi'an Jiaotong University,Xi'an 710049,China;不详)

机构地区：[1]西安交通大学,微电子学院,陕西西西安710049 [2]陕西亚成微电子股份有限公司,陕西西安710199

出　　处：《电力电子技术》2023年第6期9-12,共4页Power Electronics

基　　金：国家重点研发计划(2006WK0003);西安交通大学基本科研业务费(XZY012020018)。

摘　　要：随着功率半导体集成化的发展,智能功率器件在生产生活中获得了普遍的应用。智能功率器件在出厂前需对其过温保护(OTP)电路进行检测,而传统测试方法存在测试时间长、准确度不高的问题。因此,提出一种利用器件自身体二极管电压温度特性来表征其核心温度的方法,通过分析二极管伏安特性模型解释了其工作原理,并使用一维热传导模型分析了新旧方法测温准确性及响应时间,以此构建了智能功率器件自动化测试系统。最终通过实验验证了该系统的准确性,并对比了新旧方法的用时差异。With the development of power semiconductor integration,smart power devices have been widely used in daily life.Smart power devices need to be tested for their over-temperature protection(OTP)circuits before leaving the factory.However,the traditional testing method has the problems of taking a long time and lacking accuracy.Therefore,a method to measure the core temperature of the device is proposed by using the voltage and temperature characteristics of the device's self body diode,explaining its working principle by analyzing the diode's volt-ampere characteristic model.The differences of temperature measurement accuracy and response time between the new and the traditional methods are analyzed by using a 1D thermal model,and an automatic test system for smart power devices is built.Finally,the accuracy of the system and the time difference between the new and traditional methods are verified through experiments.

关 键 词：智能功率器件 过温保护 自动化测试系统 

分 类 号：TM933.3[电气工程—电力电子与电力传动]