基于LK8810S平台的集成运算放大电路模拟参数测试研究  

Research on Simulation Parameter Testing of the Integrated Operational Amplifier Based on LK8810S Platform

作　　者：陈梅芬 陈瑞森[1] 李伟权[1] 林少东 吴佳骏 Chen Meifen;Chen Ruisen;Li Weiquan;Lin Shaodong;Wu Jiajun(Xiamen Ocean Vocational College,Xiamen 361100,China)

机构地区：[1]厦门海洋职业技术学院,福建厦门361100

出　　处：《黄山学院学报》2023年第3期30-33,共4页Journal of Huangshan University

基　　金：福建省中青年教师教育科研项目(JAT191314)。

摘　　要：集成电路测试产业近年来得到了快速发展,已成为集成电路产业链的重要环节。文章基于LK8810S测试平台,采用C语言编写测试代码控制待测电路的输入激励并采集电路的输出信号,能快速地实现集成运算放大器的3种主要参数测试,并将结果显示在上位机。实验结果表明测试结果数据在正常范围内,且缩短了测试时间。The integrated circuit testing industry has developed rapidly in recent years and has become an important link in the integrated circuit industry chain.The article is based on the LK8810S testing platform,using C language to write test code to control the input excitation of the circuit to be tested and collect the output signal of the circuit.It can quickly achieve three main parameters testing of the integrated operational amplifier,and display the results on the upper computer.The experimental results indicate that the test results are within the normal range and shorten the testing time.

关 键 词：输入失调电压 LK8810S平台 共模抑制比 集成运放 开环增益 

分 类 号：TN606[电子电信—电路与系统]