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作 者:李鹏举 谢鹍 夏玉敏 蔡德胜 秦胜勇 Pengju Li;Kun Xie;Yumin Xia;Desheng Cai;Shengyong Qin(International Centre for Quantum Design of Functional Materials(ICQD),University of Science and Technology of China,Hefei 230026,China;CAS Key Laboratory of Strongly-Coupled Quantum Matter Physics,Department of Physics,University of Science and Technology of China,Hefei 230026,China)
机构地区:[1]International Centre for Quantum Design of Functional Materials(ICQD),University of Science and Technology of China,Hefei 230026,China [2]CAS Key Laboratory of Strongly-Coupled Quantum Matter Physics,Department of Physics,University of Science and Technology of China,Hefei 230026,China
出 处:《Chinese Physics B》2023年第6期391-394,共4页中国物理B(英文版)
基 金:Project supported by the National Key Basic Research Program of China(Grant No.2017YFA0205004);the National Natural Science Foundation of China(Grant Nos.92165201,11474261,and 11634011);the Fundamental Research Funds for the Central Universities(Grant No.WK3510000006);the Anhui Initiative Fund in Quantum Information Technologies(Grant No.AHY170000)。
摘 要:We carried out experimental investigations of the geometric effect on the electronic behavior in Pb_(1-x)Bi_(x) thin films by scanning tunneling microscopy and spectroscopy.Single crystal monolayer Pb_(0.74)Bi_(0.26) and two-monolayer Pb_(0.75)Bi_(0.25)Pb_(1-x)Bi_(x) thin films were fabricated by molecular beam epitaxy,where large surface corrugations were observed.Combined with tunneling spectroscopic measurements,it is found that atomic corrugations can widely change the electronic behaviors.These findings show that the Pb_(1-x)Bi_(x) system can be a promising platform to further explore geometry-decorated electronic behavior in two-dimensional metallic thin films.
关 键 词:electronic contribution geometric corrugation scanning tunneling microscopy Pb–Bi alloy films
分 类 号:O562[理学—原子与分子物理]
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