低介电常数陶瓷微波介电性能评价的关键问题  

Key Problems in Microwave Dielectric Characterization of Low-Dielectric-Constant Ceramics

作　　者：李雷[1] 陈湘明[1] LI Lei;CHEN Xiangming(Laboratory of Dielectric Materials,School of Materials Science and Engineering,Zhejiang University,Hangzhou 310027,China)

机构地区：[1]浙江大学材料科学与工程学院电介质材料研究室,杭州310027

出　　处：《硅酸盐学报》2023年第4期899-906,共8页Journal of The Chinese Ceramic Society

基　　金：国家自然科学基金(52272128,U20A20243)。

摘　　要：低介电常数(εr)微波介质陶瓷是未来毫米波移动通讯技术中的关键材料之一,其基本性能参数εr、Qf值及谐振频率温度系数(τf)的精确评价乃是相关研究中最基础的课题之一.TE011模式平行板法及金属谐振腔法为评价微波介电性能的通用方法,但在使用时却存在一些被长期忽视的问题,其对低εr微波介质陶瓷的研究及应用尤为重要.本综述将探讨评价低εr微波介质陶瓷性能时在TE011谐振模式的准确识别、Qf值的测试可靠性及τf的测试可靠性等方面存在的若干关键问题,并给出相应的解决方案.Low-dielectric-constant(er)microwave dielectric ceramics are one of the key materials for future mobile communication technology,and the accurate characterization for their basic performance parameters of&r,Of value and temperature-dependent coefficient of resonant frequency(tr)is one of the most fundamental issues.Parallel plate method and metal resonant cavity method with TEo1i mode are commonly used for measuring the microwave dielectric properties.However,the corresponding problems are neglected,which are especially important for the research and applications of low-er microwave dielectric ceramics.In this review,the key problems of the identification of TEon resonant mode,measurement reliability of Of value and measurement reliability of t were discussed for the characterization of low-&r microwave dielectric ceramics,and the corresponding solutions to the problems were given.

关 键 词：低介电常数 微波介电性能评价 平行板法 谐振腔法 测试可靠性 

分 类 号：TQ174.1[化学工程—陶瓷工业]