双应力交叉步进加速退化试验下大功率半导体激光器寿命预测方法  

Lifetime prediction method for high-power laser diodes under doublestress cross-step accelerated degradation test

作　　者：张业奇 王贞福[1] 李特[1] 陈琅 张佳晨 吴顺华 刘嘉辰 杨国文[1] Zhang Yeqi;Wang Zhenfu;Li Te;Chen Lang;Zhang Jiachen;Wu Shunhua;Liu Jiachen;Yang Guowen(State Key Laboratory of Transient Optics and Photonics,Xi’an Institute of Optics and Precision Mechanics,Chinese Academy of Sciences,Xi’an 710119,China;University of Chinese Academy of Sciences,Beijing 100049,China)

机构地区：[1]中国科学院西安光学精密机械研究所瞬态光学与光子技术国家重点实验室,陕西西安710119 [2]中国科学院大学,北京100049

出　　处：《红外与激光工程》2023年第5期120-129,共10页Infrared and Laser Engineering

基　　金：国家自然科学基金(61504167);陕西省自然科学基金(2022JQ-531,2019ZY-CXPT-03-05,2018JM6010,2015JQ6263);陕西省科技厅人才项目(2017KJXX-72)。

摘　　要：高可靠性已成为大功率半导体激光器实用化的重要指标之一,而寿命预测是大功率半导体激光器可靠性评估的首要环节。文中提出了一种双应力交叉步进加速退化的试验方法,对830 nm F-mount封装的大功率半导体激光器进行了四种不同的双应力条件A[22℃,1.4 A],B[42℃,1.4 A],C[42℃,1.8 A],D[62℃,1.8 A]下的电流-温度交叉步进加速退化试验研究,对光输出功率退化轨迹进行拟合,按照80%功率退化作为失效判据,结合修正后的艾琳模型和威布尔分布外推得到器件在正常工作条件下的平均失效时间(MTTF)为5811 h。文中给出了完整的加速退化模型建立过程与详细的外推寿命计算方法,并对模型进行了准确性检验,误差不超过10%。该方法相比单应力恒定加速试验方法,可以大幅度节约试验时间和试验成本,这对于大功率半导体激光器的自主研制具有重要的指导意义。Objective High reliability becomes very important for the application of high-power laser diodes,and lifetime prediction is the primary aspect of reliability assessment of high-power laser diodes.Accelerated degradation test is a test method to accelerate the degradation process in the laboratory in accordance with the degradation model,which can obtain statistically significant lifetime prediction in a short time.With the advancement of device technology and its reliability,single-stress accelerated degradation test faces problems such as long test time,high cost,and excessive stress application in the degradation mechanism.Therefore,it is necessary to propose an accelerated degradation test for lifetime prediction of highly reliable and long-lived devices.For this purpose,a double-stress cross-step accelerated degradation technological method is designed in this paper.Methods A double-stress cross-step accelerated degradation test is proposed.Aging test platform for high-power laser diodes was built(Fig.5).The device(Fig.4)was subjected to 1600 h accelerated degradation test,and the accelerated degradation data of optical output power under different stress conditions were collected(Tab.1).Performance degradation model was established to analyze the data with the accelerated model to obtain the lifetime prediction values,and the accuracy of the model was tested for significance(Tab.5).Results and Discussions The overall scheme of high-power laser diodes lifetime prediction(Fig.1)has three main steps of bringing degradation data into the model,fitting the lifetime probability density distribution function,and checking accuracy.The double-stress cross-step accelerated degradation test sets the temperature and current as the stress conditions,and the two stress conditions are cross-stepped to form a total of four different stress conditions(Fig.2)as A[22℃,1.4 A],B[42℃,1.4 A],C[42℃,1.8 A],and D[62℃,1.8 A],respectively.The performance degradation model is built according to the YamaKoshi equation and the las

关 键 词：大功率半导体激光器 加速退化试验 双应力 寿命 

分 类 号：TN248.4[电子电信—物理电子学]