小麦旗叶相关性状的QTL定位  

QTL Mapping of Flag Leaf-Related Traits in Wheat

作　　者：苗含笑 张耀元 陈春环[1] 吉万全[1] MIAO Hanxiao;ZHANG Yaoyuan;CHEN Chunhuan;JI Wanquan(College of Agronomy,Northwest A&F University,Yangling,Shaanxi 712100,China)

机构地区：[1]西北农林科技大学农学院,陕西杨凌712100

出　　处：《麦类作物学报》2023年第7期842-847,共6页Journal of Triticeae Crops

基　　金：国家重点研发计划子课题(2016YFD0100302)。

摘　　要：旗叶相关性状是影响小麦植株结构、光合能力和产量潜力的重要因素。为发掘控制小麦旗叶性状相关的数量性状位点(QTL),以品冬34和MY11847为亲本构建的含有356个株系的F 7:8重组自交系(recombinant inbred line,RIL)群体为材料,基于本课题组前期利用简化基因组测序(specific-locus amplified fragment sequencing,SLAF-seq)结合传统分群分析法(bulk segregant analysis,BSA)技术构建的高密度遗传连锁图谱,对小麦灌浆期旗叶长、旗叶宽和旗叶面积进行QTL定位。结果表明,共检测到9个旗叶长QTL、7个旗叶宽QTL和8个旗叶面积QTL,可解释1.71%~14.71%的表型变异。其中,旗叶长位点QFLL.nwafu-3D和QFLL.nwafu-2D.1、旗叶宽位点QFLW.nwafu-6B以及旗叶面积位点QFLA.nwafu-3D的表型贡献率均大于10%,为主效QTL,且QFLL.nwafu-3D和QFLA.nwafu-3D共定位于相同遗传区间。Flag leaf-related traits are important factors affecting wheat plant structure,photosynthetic capacity and yield potential.To discover the QTLs controlling the flag-related characteristics in wheat,an F 7:8 recombinant inbred line(RIL)population consisting of 356 lines was constructed from a cross between Pindong 34 and MY11847.Based on the specific-locus amplified fragment sequencing(SLAF-seq)and bulk segregant analysis(BSA)technologies,the high density genetic linkage map was constructed.QTL analysis was carried out on the flag leaf length,flag leaf width,and flag leaf area during the grain filling stage of wheat.The results showed that a total of nine QTLs for flag leaf length,seven QTLs for flag leaf width and eight QTLs for flag leaf area were detected,and the range of their phenotypic contribution was 1.71%-14.71%.Among them,the phenotypic variation explained of QFLL.nwafu-3D,QFLL.nwafu-2D.1,QFLW.nwafu-6B and QFLA.nwafu-3D were all more than 10%,which are the major QTLs,and QFLL.nwafu-3D and QFLA.nwafu-3D[KG0.5mm]were co-localized to the same genetic region.

关 键 词：小麦 旗叶 QTL RIL 

分 类 号：S512.1[农业科学—作物学] S330