红外光学系统光谱透射比校准技术  

Spectral transmittance calibration technology of infrared optical system

作　　者：李四维[1] 王学新[1] 谢毅[1] 郭羽[1] 闫晓宇[1] 杨毓鑫 张旭 LI Siwei;WANG Xuexin;XIE Yi;GUO Yu;YAN Xiaoyu;YANG Yuxin;ZHANG Xu(The First Scale Optical Metrology Station of the Science,Technology and Industry for National Defense,Xi'an Institute of Applied Optics,Xi'an 710065,China)

机构地区：[1]西安应用光学研究所国防科技工业光学一级计量站,陕西西安710065

出　　处：《应用光学》2023年第4期868-873,共6页Journal of Applied Optics

基　　金：国防科工局技术基础项目。

摘　　要：针对红外光学系统透射比参数无法准确测量的问题,开展了红外光学系统光谱透射比测量和校准技术研究。通过对积分球法、大面积均匀源法等测量方法进行分析,研究构建了基于回返射法的红外光学系统光谱透射比校准装置,并建立了完整的光谱透射比量值溯源和量传链条。利用该装置实现了2μm~14μm波长范围的光谱透射比测量,对测量结果进行不确定度分析,结果为2%。相对于以往的透射比测量装置,该装置的测量结果具有更高的准确性和可靠性。Aiming at the problem that transmittance parameters of infrared optical system cannot be accurately measured,the measurement and calibration technology for spectral transmittance of infrared optical system were studied.Based on the analysis of measurement methods such as integrating sphere method and large-area uniform source method,a calibration device for spectral transmittance of infrared optical system based on method of reflection was studied and constructed,and the complete quantity traceability and quantity transmission chain of spectral transmittance were established.The device was used to measure the spectral transmittance in the wavelength range of 2μm~14μm,and the uncertainty analysis of the measurement results showed that the result was 2%.Compared with the previous measurement device,the measurement results of the proposed device have higher accuracy and reliability.

关 键 词：红外光学系统 光谱透射比测量 回返射法 测量不确定度 

分 类 号：TN216[电子电信—物理电子学]