基于FPGA和STM32的放大电路特性测试仪设计  

Design of Amplifier Circuit Characteristic Tester Based on FPGA and STM32

作　　者：孙艳丽 林星瑞 叶李锐 王国庆 SUN Yanli;LIN Xingrui;YE Lirui;WANG Guoqing(Naval Aviation University,Yantai 264000)

机构地区：[1]海军航空大学,烟台264000

出　　处：《舰船电子工程》2023年第4期163-166,189,共5页Ship Electronic Engineering

摘　　要：设计一简易电路特性测试仪,测量特定放大电路的特性并自动判断由于元器件变化而引起故障。该测试仪的硬件电路由STM32处理器模块、FPGA模块、模数转换模块、精密整流电路、电压隔离器等基本电路组成。其中FPGA模块完成数据分析功能,STM32实现正弦波信号的产生、基本特性数据的处理和显示控制。通过实际电路测试,该测试仪能实现特定放大电路特性测试并以此为依据进行常见故障的诊断。A simple circuit characteristic tester is designed to measure the characteristics of a specific amplifier circuit and judge the fault caused by the change of components automatically.The circuit of the tester consists of STM32 microprocessor mod⁃ule,FPGA module,analog-digital conversion module,accurate rectifier,voltage isolator and other basic circuits.FPGA module completes the data analysis function,and STM32 realizes the generation of sine wave signal,the processing and display of basic characteristic data.Through the actual circuit test,the tester can realize the characteristic test of specific amplifier circuit and diag⁃nose the common faults based on it.

关 键 词：FPGA STM32 幅频特性 故障检测 

分 类 号：TN709[电子电信—电路与系统]