基于SPICE模型的运算放大器ESD故障机制分析  

Analysis of ESD Failure Mechanism of Operational Amplifier Based on SPICE Model

作　　者：史如新 嵇建飞 张伟 SHI Ru-xin;JI Jian-fei;ZHANG Wei(State Grid Jiangsu Electric Power Co.,Ltd.Changzhou Power Supply Branch,Changzhou 213000;Electric Power Research Institute of State Grid Jiangsu Electric Power Co.,Ltd,Nanjing 210094)

机构地区：[1]国网江苏省电力有限公司常州供电分公司,常州1213000 [2]国网江苏省电力有限公司电力科学研究院,南京210094

出　　处：《环境技术》2023年第6期109-113,共5页Environmental Technology

基　　金：中国国家电网公司科技项目,项目编号:5500-202055070A-0-0-00。

摘　　要：运算放大器是智能电网中重要的电路元器件,其性能对电网的正常运行具有至关重要的影响。为了提高智能电网的安全性和稳定性,需要对运算放大器在复杂的电磁环境下的可靠性进行验证。本文以UA741模拟集成运算放大器为研究对象,通过分析典型静电放电(ESD)干扰下的电磁效应,研究了基于SPICE模型的MOS的电压和电流特性以及故障机制。通过定位故障MOS,为进一步研究ESD抑制提供了理论依据。本研究结果对于提高智能电网中电路和电力设备的抗干扰能力,保障电网的稳定运行具有重要意义。The performance of the operational amplifier has a vital influence on the normal operation of circuit and power equipment in smart grid.In order to improve the security and stability of the smart grid,the reliability of the operational amplifier in the complex electromagnetic environment should be verified.The UA74l analog integrated operational amplifier is taken as the research object in this paper,the electromagnetic effect under typical electro-static discharge(ESD)interference is analyzed,the voltage and current characteristics and the failure mechanism of the Mos based on SPICE model is studied,and the failure MOS is located,which provides a theoretical basis for further research on ESD suppression.

关 键 词：ESD 故障机制 MOS 运算放大器 SPICE模型 

分 类 号：TP342.1[自动化与计算机技术—计算机系统结构]