非接触式原子力显微镜在分子几何结构解析中的应用进展  

The Progress in Application of Non-Contact Atomic Force Microscopy to Molecular Geometric Structure Analysis

作　　者：金珍 张慧 马泓冰 张海明[2] 迟力峰[2] Jin Zhen;Zhang Hui;Ma Hongbing;Zhang Haiming;Chi Lifeng(Analysis and Test Center,Soochow University,Suzhou,215123;Institute of Functional Nano&Soft Materials(FUNSOM),Soochow University,Suzhou,215123)

机构地区：[1]苏州大学分析测试中心,苏州215123 [2]苏州大学功能纳米与软物质研究院,苏州215123

出　　处：《化学通报》2023年第7期769-774,共6页Chemistry

基　　金：国家自然科学基金项目(22072103)资助。

摘　　要：具有化学键分辨的非接触式原子力显微(nc-AFM)表征展现出了优异的分子结构解析能力,是近十年来显微表征领域里的代表性进展,成为表面分子相关研究的重要工具。本文首先介绍了化学键分辨的非接触式原子力显微镜的核心部件:qPlus传感器,以及实现化学键分辨所必须的针尖修饰技术;围绕该表征方法在分子几何结构成像上的功能,重点介绍了nc-AFM在天然产物结构确定以及表面在位反应研究上的最新进展。Non-contact atomic force microscopy(nc-AFM)with chemical-bond-resolved functionality represents the most remarkable advance in microscopic characterization,becoming a powerful tool in the characterization of molecule-related phenomena on surfaces.In this review,we first briefly introduce the core component of nc-AFM:the qPlus sensor,and the necessary technique to achieve chemical bond resolved characterization:tip functionalization.Focusing on the main function of nc-AFM in chemical-bond-resolved imaging,recent advances in this field are reviewed with an emphasis on the structural determination of natural products and related applications in the area of on-surface synthesis.

关 键 词：非接触式原子力显微术 qPlus传感器 化学键分辨图 表面在位反应 

分 类 号：TH742[机械工程—光学工程] TQ28[机械工程—仪器科学与技术]