硅二极管低温温度计性能实验与分析  

Experimental research on performance of silicon diode cryogenic thermometer

作　　者：李泽宇 蒋燕阳 张成俊 邵峰 邓伟峰 Li Zeyu;Jiang Yanyang;Zhang Chengjun;Shao Feng;Deng Weifeng(College of Energy,Soochow University,Suzhou 215000,China;Photon Technology(Zhejiang)Co.,Ltd.,Jiaxing 314000,China)

机构地区：[1]苏州大学能源学院,苏州215000 [2]赋同量子科技(浙江)有限公司,嘉兴314000

出　　处：《低温与超导》2023年第6期77-83,共7页Cryogenics and Superconductivity

基　　金：江苏省高等学校自然基金(21KJB470012);“量子安全通信和数据透明加密技术研究及应用-高性能超导纳米线单光子探测系统研发及产业化”项目(2021C01188)资助。

摘　　要：主要介绍了一款硅二极管温度计以及其配套干、湿式低温测试系统,对其灵敏度、互换性、测温精度、重复性等进行实验,并拟合了标准特性曲线。结果表明:互换性温差低至±0.2 K@4 K;低温下灵敏度最高可达-38 mV/K;测温精度<12 mK@77 K;适合低温下的测温应用。A silicon diode thermometer,equiped with dry and wet test system at low temperature,was mainly introduced.An experiment was carried out on the thermometer sensitivity,interchangeability,temperature measurement accuracy and repeatabili⁃ty,the standard characteristic curve was fitted.Results show that the deviation of interchangeability is less than 2 mK@4 K,the sensitivity at low temperature can reach up to-38 mV/K,the temperature measurement accuracy is less than 12 mK@77 K.The thermometer is suitable for temperature measurement applications in low temperature scenarios.

关 键 词：低温温度计 硅二极管 低温测量 低温系统 

分 类 号：TB61[一般工业技术—制冷工程] TB632