X射线荧光光谱法测定工业氧化铝中的微量元素  

Determination of Trace Elements in Industrial Alumina by X-ray Fluorescence Spectroscopy

作　　者：杨朝芳 Yang Chaofang(Yangquan Comprehensive Inspection and Testing Center,Yangquan Shanxi 045000,China)

机构地区：[1]阳泉市综合检验检测中心,山西阳泉045000

出　　处：《山西冶金》2023年第6期30-32,35,共4页Shanxi Metallurgy

摘　　要：采用工业氧化铝系列标准样品,加Li_(2)B_(4)O_(7)-LiBO_(2)混合熔剂熔铸成玻璃样片,建立测定氧化铝微量元素(Ga_(2)O_(3)、ZnO、CaO、SiO_(2)、Fe_(2)O_(3)、TiO_(2)、K_(2)O和Na_(2)O)的X射线荧光光谱分析曲线。通过谱线校正消除谱线干扰,按照经验α系数法进行基体校正,消除样品中各元素的吸收增强效应,校准曲线精密度品质因子低于0.07。使用建立的分析曲线对样品各微量组分进行检测,结果表明:各组分检测值相对标准偏差介于0.53%~9.09%之间,检测结果误差在GB/T 6609.30—2009标准要求的允许范围内。该检验方法的检验结果达到了精密度和准确度要求,为指导工业生产以及实验室质量控制奠定了基础。Using industrial alumina series standard samples and adding Li_(2)B_(4)O_(7) LiBO_(2) mixed flux to melt and cast glass samples,an X-ray fluorescence spectroscopy analysis curve was established for the determination of trace elements(Ga_(2)O_(3),ZnO,CaO,SiO_(2),Fe_(2)O_(3),TiO_(2),K_(2)O,and Na_(2)O)in alumina.Eliminating spectral interference through spectral line correction,based onαcoefficient method for matrix correction,the absorption enhancement effect of each element in the sample was eliminated,and the precision quality factor of the calibration curve was lower than 0.07.The established analytical curve was used to detect each trace component of the sample,and the results showed that the relative standard deviation of the detection values for each component was between 0.53%and 9.09%,and the error of the detection results was within the allowable range required by the GB/T 6609.30-2009 standard.The inspection results of this inspection method meet the requirements of precision and accuracy,laying the foundation for guiding industrial production and laboratory quality control.

关 键 词：工业氧化铝 熔融玻璃片法 X射线光谱分析 基体校正 

分 类 号：TF03.1[冶金工程—冶金物理化学]