Role of solute in stress development of nanocrystalline films during heating:An in situ synchrotron X-ray diffraction study  

作　　者：Jing Wang Xiaohu Li Emad Maawad Lu Han Yuan Huang Yongchang Liu Zumin Wang 

机构地区：[1]State Key Lab of Hydraulic Engineering Simulation and Safety,School of Materials Science and Engineering,Tianjin University,Tianjin 300350,China [2]German Engineering Materials Centre at MIZ,Helmholtz-Zentrum Geesthacht,Garching D-85747,Germany [3]Helmholtz-Zentrum Geesthacht,Institute of Materials Physics,Max-Planck-Str.1,Geesthacht D-21502,Germany

出　　处：《Journal of Materials Science & Technology》2023年第13期188-197,共10页材料科学技术（英文版）

基　　金：supported by the National Natural Science Foundation of China (No.51971153);the National Key Research and Development Program of China (No.2017YFE0302600)。

摘　　要：The effect of the solute(Mo)on the stress development of nanocrystalline Ni and Ni-Mo films upon heat-ing has been investigated in real time using in situ synchrotron X-ray diffraction.The complex and distinct relationship between the film stress and grain boundaries(GBs)has been examined by the evolution of real-time intrinsic stress in combination with the in situ grain growth and thermal characterizations.The different intrinsic stress evolutions in the Ni and Ni-Mo films during the heating process result from the modification of GBs by Mo alloying,including GB amorphization,GB relaxation,and GB segregation.It has been found that GBs play a vital role in the stress development of nanocrystalline films.The addition of a solute can not only inhibit grain growth but also influence the stress evolution in the film by changing the atomic diffusivity at the GBs.This work provides valuable and unique insights into the effect of solutes on stress development in nanocrystalline films during annealing,permitting control of the film stress through solute addition and heat treatment,which is critical for improving the design,processing,and lifetime of advanced nanocrystalline film devices at high temperatures.

关 键 词：Synchrotron X-ray diffraction Nanocrystalline film SOLUTE Stress development Grain boundary 

分 类 号：O647.33[理学—物理化学] X703[理学—化学]