用于探测器标定的单能X射线源研究  

Single energy X-ray source for calibration of X-ray detectors

作　　者：许泽方 闫永清 强鹏飞 唐波[3] 盛立志[1] 苏桐[1] 李昀 张蕊利[1] Xu Zefang;Yan Yongqing;Qiang Pengfei;Tang Bo;Sheng Lizhi;Su Tong;Li Yun;Zhang Ruili(State Key Laboratory of Transent Optics and Photonics,Xi’an Institute of Optics andPrecision Mechanics,Chinese Academy of Sciences,Xi’an 710119,China;University of Chinese Academy of Sciences,Beijing 100084,China;Northwest Nuclear Technology Institute,Xi’an 710024,China)

机构地区：[1]中国科学院西安光学精密机械研究所,西安710119 [2]中国科学院大学,北京100049 [3]西北核技术研究所,西安710024

出　　处：《强激光与粒子束》2023年第9期61-66,共6页High Power Laser and Particle Beams

基　　金：国家重点实验室基金项目(SKLIPR2021);陕西省自然科学基础研究计划项目(2023-JC-ZD-40);中国科学院西部青年学者项目(XAB2020YN13);国家自然科学基金项目(62271483)。

摘　　要：为提高X射线探测器的标定精度,在荧光X射线源的基础上,提出在荧光X射线出射通道设置滤光片的方法提高X射线纯度。通过蒙特卡罗建立仿真模型,分析了辐射体发生K层光电效应的概率与原子序数的关系,并得到荧光强度和纯度随滤光片厚度的变化曲线。在大气环境下,采用硅漂移半导体探测器测试了荧光X射线源的能谱分布和光子流量,分析X射线管管电压对光子流量和荧光纯度的影响。在辐射体材料为铜,滤光片(镍)厚度为0μm、10μm和30μm时,测得的荧光X射线纯度分别为75.61%、85.38%和84.25%,光子流量分别为3425 phs/s、2023 phs/s和1192 phs/s,确认了滤光片厚度对荧光X射线纯度和强度的影响,为解决荧光X射线光源单色性不足难以对X射线探测器进行高精度标定的问题提供了方向。To improve the calibration accuracy of X-ray detectors,this paper presents a method of placingfilters in fluorescent X-ray emission channels to improve the purity of X-rays.Monte Carlo simulation model wasestablished to analyze the relationship between the probability of photoelectric effect in K layer and the atomicnumber,and the curve of fluorescence intensity and purity with filter thickness was obtained.In atmosphericenvironment,the energy spectrum distribution and photon flux of fluorescent X-ray source were measured by silicondrift semiconductor detector,and the effect of X-ray tube voltage on photon flux and fluorescence purity was analyzed.When the radiator material is copper and the thickness of the filter(nickel)is 0μm,10μm and 30μm,the purity offluorescence X-ray measured is 75.61%,85.38%and 84.25%,and the photon flux is 3425 phs/s,2023 phs/s and1192 phs/s,respectively.The influence of filter thickness on the purity and intensity of fluorescent X-ray is confirmed,which provides a direction for solving the problem that it is difficult to calibrate X-ray detectors with high accuracydue to the lack of monochromatism of fluorescent X-ray light source.

关 键 词：荧光X射线源 滤光片 探测器标定 

分 类 号：O572.212[理学—粒子物理与原子核物理]