C8051F系列混合信号MCU测试方法与实现  

Analysis of Testing Method and Implementation for C8051F Series Mixed Signal MCU

作　　者：杨超 金荣康 张金凤 吴迪 YANG Chao;JIN Rongkang;ZHANG Jinfeng;WU Di(Beijing Zhenxing Institute of Metrology and Testing,Beijing 100074,China)

机构地区：[1]北京振兴计量测试研究所,北京100074

出　　处：《集成电路应用》2023年第7期22-25,共4页Application of IC

摘　　要：阐述C8051F系列MCU测试程序的设计方法,包括测试程序和软硬件方案、通信协议制定规则、配置程序编写方法,基于EVA-100实现C8051F330测试程序,在此基础上进行扩展,探讨整个系列MCU测试程序的扩展方案。This paper expounds the design method of the C8051F series MCU testing program, including testing programs and software and hardware solutions, communication protocol development rules, configuration program writing methods, and the implementation of the C8051F330 testing program based on EVA-100. On this basis, the extension is carried out to explore the expansion plan of the entire series MCU testing program.

关 键 词：集成电路测试 C8051F330 MCU 通信协议 EVA-100 

分 类 号：TN407[电子电信—微电子学与固体电子学] TP368.1[自动化与计算机技术—计算机系统结构]