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作 者:朱瑞文 王雅文[1,2] 林欢 李帅赟 吴彦芳 ZHU Ruiwen;WANG Yawen;LIN Huan;LI Shuaiyun;WU Yanfang(State Key Laboratory of Networking and Switching Technology,Beijing University of Posts and Telecommunications,Beijing 100876,China;Guangxi Key Laboratory of Cryptography and Information Security,Guilin 541004,China)
机构地区:[1]北京邮电大学网络与交换技术国家重点实验室,北京100876 [2]广西密码学与信息安全重点实验室,桂林541004
出 处:《北京邮电大学学报》2023年第4期9-14,共6页Journal of Beijing University of Posts and Telecommunications
摘 要:为降低测试用例集约简过程中故障检测能力的损失,减少偶然正确性现象对测试可靠性的不利影响。提出了一种基于层次聚类的测试用例集约简方法,使用欧氏距离计算测试用例的相似性,得出相异矩阵作为聚类的输入;另外,基于变异测试能够提高测试用例集故障检测能力的特性,给出偶然正确性概率的计算公式,在结果簇中使用基于变异测试的测试用例选择算法获取约简后的测试用例集。实验结果表明,所提方法比充分的和其他不充分的测试用例约简方法分别降低了9.8%和12%的故障检测能力的损失。To reduce the loss of fault detection capability during the test suite reduction process and to minimize the negative impact of the coincidental correctness on test adequacy.A test suite reduction method is proposed based on hierarchical clustering,which uses Euclidean distance to calculate the similarity of test cases and derives the dissimilarity matrix as the input for clustering.In addition,based on the property that mutation testing can improve the fault detection ability of test suite,a formula for calculating the probability of coincidental correctness is given.The reduced test suite are obtained in the resultant clusters using the mutation testing-based test case selection algorithm.The experimental results show that the proposed method reduces the loss of fault detection capability by 9.8%and 12%compared to adequate and other inadequate test suite reduction methods,respectively.
关 键 词:层次聚类 测试用例集约简 变异测试 偶然正确性 故障检测能力
分 类 号:TP311[自动化与计算机技术—计算机软件与理论]
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