基于LK8820测试机的芯片参数测试研究  

Research on Chip Parameter Testing Based on LK8820 Testing Machine

作　　者：余蓓敏[1] YU Beimin(College of Electronic Engineering,Anhui Electronic Information Vocational and Technical College,Bengbu 233000,China)

机构地区：[1]安徽电子信息职业技术学院电子工程学院,安徽蚌埠233000

出　　处：《长春大学学报》2023年第8期19-23,共5页Journal of Changchun University

基　　金：安徽省教育厅项目(KJ2021A1484,2021jyxm0113)。

摘　　要：作为LK8810S升级版本的LK8820测试机,硬件资源更加丰富,测试机函数进一步优化。分析了LK8820测试机的特点,并以CD4511芯片为例,通过CD4511测试电路设计和搭建、静态工作电流测试、输出高电平电压测试和输入高电平电流三种参数的测试,探究基于LK8820测试机的芯片参数测试的方法和过程。此种基于LK8820的数字芯片直流参数测试方案可操作性强,测试速度快,推动了OBE理念教学,提升了集成电路产业链效率。As an upgraded version of LK8810S,LK8820 testing machine has richer hardware resources and more optimized testing machine functions.This paper analyzes the characteristics of LK8820 testing machine,and takes CD4511 chip as an example to test three parameters such as static working current testing,output high-level voltage testing and input high-level current testing through the design and construction of CD4511 testing circuit,and explores the method and process of chip parameter testing based on LK8820 testing machine.This digital chip DC parameter testing scheme based on LK8820 has strong operability and fast testing speed,promoting OBE concept teaching and improving the efficiency of the integrated circuit industry chain.

关 键 词：LK8820 CD4511 参数测试 

分 类 号：TP311[自动化与计算机技术—计算机软件与理论]