基于Peck模型的汽车电子产品加速试验设计  

Design of Acceleration Test for Automotive Electronic Products Based on Peck Model

作　　者：刘建飞 王涛 王秀鑫 曲岚峰 杨宸宁 LIU Jianfei;WANG Tao;WANG Xiuxin;QU Lanfeng;YANG Chenning(Weichai Power Co.,Ltd,Weifang 261000,China)

机构地区：[1]潍柴动力股份有限公司,山东潍坊261000

出　　处：《汽车电器》2023年第10期92-94,共3页Auto Electric Parts

摘　　要：随着汽车电子产品寿命的不断增加,加速老化寿命试验已成为产品研发过程中必不可少的一环。本文采用Peck模型对汽车电子产品的加速模式进行分析,结合指数寿命分布与MTBF进行加速老化寿命试验设计。通过介绍实际加速老化寿命试验的设计过程,为相关从业者提供参考。With the increasing life span of automotive electronic products,accelerated life aging test has become an indispensable part of product research and development.In this paper,the acceleration mode of automotive electronic products was analyzed by Peck model,and the accelerated aging life test was designed by combining exponential life distribution and MTBF.The design process of accelerated life aging test is introduced to provide reference for relevant practitioners.

关 键 词：Peck模型 加速老化寿命试验 指数分布 MTBF 汽车电子产品 

分 类 号：U463.6[机械工程—车辆工程]