超高频(UHF)芯片测试的管理优化研究  

Management Optimization Study of Ultra-High-Frequency(UHF)Chip Testing

作　　者：朱小炜 栾津 ZHU Xiao-wei;LUAN Jin(Southwest Jiaotong University)

机构地区：[1]西南交通大学

出　　处：《中国集成电路》2023年第10期87-91,共5页China lntegrated Circuit

摘　　要：本文主要阐述基于应用管理科学的理论和方法来研究芯片测试项目管理,并提出优化芯片测试项目管理的建议。研究发现M(上海集成电路技术与产业促进中心检测实验室)检测实验室在UHF芯片检测项目中存在管理问题,因此提出了基于管理学模型的优化方案,从而提高M检测实验室在UHF芯片检测项目上的效率。This paper mainly elaborates on the theory and methods of Management Science to study the management of chip test project,and puts forward suggestions to optimize the management of chip test project.The research found that there were management issues in UHF chip testing project in M inspection laboratory,so an optimization scheme based on management model was proposed to improve the efficiency of M inspection laboratory in UHF chip test project.

关 键 词：网络图 管理优化 UHF芯片测试 

分 类 号：TN407[电子电信—微电子学与固体电子学]