微波器件S参数全温在线测试技术研究  

Research on On-Line Measurement Technology of S-Parameter of Microwave Devices

作　　者：肖苗苗[1] 任翔[1] 马帅帅 李静[1] 高鹏鹏 邓嘉辉 XIAO Miao-miao;REN Xiang;MA Shuai-shuai;LI Jing;GAO Peng-peng;DENG Jia-hui(Aerospace Science and Industry Defense Technology Research Testing Center,Beijing 100854)

机构地区：[1]航天科工防御技术研究试验中心,北京100854

出　　处：《环境技术》2023年第8期126-132,共7页Environmental Technology

摘　　要：由于装备应用环境的复杂性,对微波器件的全温性能的要求越来越高,特别是高低温下的性能指标。当前国内微波器件生产厂商在微波器件设计研制方面具备了较强的技术能力,但对于该类器件的测试大都依据自身产品特点开发测试系统,测试一致性不高,尤其是关键指标S参数在高低温下的测试误差较大。因此需要对微波器件S参数的高低温校准、测试方法进行研究,提出一套全温在线测试方案,提高测试一致性和准确度。Due to the complexity of the equipment application environment,the requirement for the total temperature performance of microwave devices is getting higher and higher,especially at high and low temperatures.At present,domestic microwave device manufacturers have strong technical ability in the design and development of microwave devices,but most of the testing systems for such devices are developed based on the characteristics of self-developed products,and the test consistency is not high,especially the test error of the key index S-parameter is large at high and low temperatures.Therefore,it is necessary to study the high and low temperature calibration and test method of microwave device S parameter,and put forward a set of full-temperature online test scheme to improve the test consistency and accuracy.

关 键 词：微波器件 S参数 高低温测试 

分 类 号：TJ765.4[兵器科学与技术—武器系统与运用工程]