椭圆柱面弯晶谱仪研制与应用  

Design and Application of Elliptical Crystal Spectrometer

作　　者：邢立娜 李朝阳 朱宁 XING Lina;LI Chaoyang;ZHU Ning(Anhui Specreation Instrument Technology Co.,Ltd.,Hefei 230088,Anhui,China)

机构地区：[1]安徽创谱仪器科技有限公司,安徽合肥230088

出　　处：《流体测量与控制》2023年第4期74-77,共4页Fluid Measurement & Control

基　　金：合肥综合性国家科学中心资助项目(2021CPZC002)。

摘　　要：为了诊断激光等离子体X射线,人们研制了光栅谱仪和晶体谱仪。当晶体谱仪覆盖的能量范围较宽时,则要求入射光在晶体上的Bragg角变化范围较大。本研究采用椭圆弯晶作为分光元件。美国Sandia国家实验室研制的单通道椭圆弯晶谱仪利用云母晶体作色散元件,椭圆的焦距为1 200 mm,测量的X射线能量范围为0.7~1.25 keV。本晶体谱仪采用三通道设计,可测量的X射线能量范围为1~10 keV,测谱范围较宽。In order to diagnose laser plasma X-rays,grating spectrometers and crystal spectrometers were developed.If the crystal spectrometer can cover a wide range of energy,then it requires that the Bragg angle of the incident light on the crystal varies a wide range,and this study uses an elliptical curved crystal as the spectroscopic element.Hammel and others of Sandia National Laboratory in the United States have developed a single-channel elliptical curved crystal spectrometer,using mica crystals as dispersion elements,the focal length of the ellipse is 1200 mm,and the measured X-ray energy range is 0.7‒1.25 keV.This crystal spectrometer adopts a three-channel design,and the X-ray energy range that can be measured is 1‒10 keV,and has a wide spectral range.

关 键 词：晶体谱仪 X射线诊断 光谱 弯晶 

分 类 号：TH74[机械工程—光学工程]