导弹机内测试技术的国内外发展现状  

Development Status of Missile BIT Technology at Home and Abroad

作　　者：吴伟 梁旗 林达 崔北鹏 丁伟 WU Wei;LIANG Qi;LIN Da;CUI Beipeng;DING Wei(Shanghai Electro-Mechanical Engineering Institute,Shanghai 201109,China)

机构地区：[1]上海机电工程研究所,上海201109

出　　处：《计算机测量与控制》2023年第10期1-5,39,共6页Computer Measurement &Control

摘　　要：导弹武器系统的综合测试是产品研发和使用中的重要保障技术,在武器系统的全寿命周期中扮演着越来越重要的角色;机内测试技术是提高系统测试性的关键方法之一,作为一种能够在设备或系统等测试单元内部自检的技术,机内测试在导弹测试领域中被广泛使用;介绍了国内外对机内测试的基本定义、特点、作用、虚警及抑制等发展的现状,并主要聚焦于导弹武器系统中的机内测试案例;针对机内测试在导弹领域应用中存在的问题,讨论了满足未来新一代导弹测试性需求的可能途径,并对机内测试技术未来的发展趋势进行了探讨和展望。The comprehensive test of missile weapon system is an important guarantee technology in product development and use,and it plays an increasingly important role in the life cycle of weapon system.Built-in Test(BIT)is one of key methods to improve the testability of system,which is a kind of test technology for internal self-test of equipment or system,so it is widely used in the field of missile test.This paper introduces the development status such as basic definition,characteristics,functions,false alarm and its reducing strategies of BIT at home and abroad,and mainly focuses on the BIT cases in missile weapon systems.In view of the problems existing in the application of BIT in missile field,the possible ways to meet the testability requirements of new generation missiles in the future are discussed,and the future development trend of BIT technology is discussed and prospected.

关 键 词：导弹 电气系统 机内测试 测试方法设计 测试性 虚警 

分 类 号：TN06[电子电信—物理电子学] TM938[电气工程—电力电子与电力传动]