Characterization of FEEWAVE,a low‑power waveform digitizer ASIC with 15‑ps time resolution  

作　　者：Yu‑sheng Wang Jia‑yi Ren Wei Wei Jie Zhang Pei‑ran Ye Xiao‑shan Jiang Zheng Wang 

机构地区：[1]Institute of High Energy Physics,Chinese Academy of Sciences,19B Yuquan Rd,Shijingshan District,Beijing,China [2]State Key Laboratory of Particle Detection and Electronics of China,19B Yuquan Rd,Shijingshan District,Beijing,China [3]University of Chinese Academy of Sciences,19A Yuquan Rd,Shijingshan District,Beijing,China [4]Spallation Neutron Source Science Center,Zhongziyuan Road,Dalang,Dongguan 523803,China

出　　处：《Radiation Detection Technology and Methods》2023年第3期410-417,共8页辐射探测技术与方法（英文）

基　　金：This work was supported by the Jiangmen Underground Neutrino Observatory(JUNO)—the Strategic Priority Research Program of the Chinese Academy of Sciences(XDA10010200);the National Natural Science Foundation of China(No.11505205);the Youth Innovation Promotion Association of the Chinese Academy of Sciences(No.Y201905).

摘　　要：Purpose FEEWAVE is a chip with a waveform digitizer based on a switched capacitor array(SCA).A SCA uses capacitor arrays to store waveforms and exhibits low-power consumption and high time resolution performance.However,the limitations of the chip manufacturing process induce sampling interval and digitization deviations between different cells,which affects the performance of the chip.Methods Calibration was performed on the SCA sampling part on the FEEWAVE chip to obtain more accurate digitized output and time intervals between the sampling cells.Experiments were carried out according to the proposed amplitude and time calibration methods,and the time resolution of the chip was further improved by a fitting algorithm.Results and conclusion Through the calibration algorithm,the time resolution of the SCA sampling part of the chip reached 9.0 ps after calibration.In the self-test of the electronics time performance,the time measurement after leading-edge fitting and calibration was approximately 12.3 ps.In the joint test with silicon photomultiplier detectors,the time resolution of the SCA part was low and comparable to the resolution of the oscilloscope after calibration algorithm and waveform fitting.

关 键 词：Waveform sampling SCA CALIBRATION 

分 类 号：TP3[自动化与计算机技术—计算机科学与技术]