护套厚度和表面污秽对微波反射法检测绝缘子内部缺陷的影响研究  

Study on the Influence of Sheath Thickness and Surface Pollution on the Internal Defect Detection of Insulator Using Microwave Reflection Method

作　　者：裴云庆 李泰霖 王飞风 王斌 蒋圣超 PEI Yunqing;LI Tailin;WANG Feifeng;WANG Bin;JIANG Shengchao(Electric Power Research Institute of Guangxi Power Grid Co.,Ltd.,Guangxi Key Laboratory of Intelligent Control and Maintenance of Power Equipment,Guangxi Nanning 530023,China)

机构地区：[1]广西电网有限责任公司电力科学研究院,广西电力装备智能控制与运维重点实验室,广西南宁530023

出　　处：《广西电力》2023年第2期56-61,91,共7页Guangxi Electric Power

基　　金：广西电网公司科技项目(GXKJXM20210305)。

摘　　要：微波反射因具有可以实现无接触测量以及操作简便的优势而适于实现复合绝缘子内部缺陷检测。在检测过程中,复合绝缘子自身状况也是影响检测结果的重要方面之一。本文重点考察了护套厚度、表面污秽对微波反射法检测结果的影响,研究得出护套厚度变化会显著影响微波检测结果,微波反射信号强度随护套厚度呈周期性曲线变化,但是在实际复合绝缘子中一般护套厚度偏差不会超过1.5 mm,相应地微波反射信号强度变化也限于在一定范围内波动;当护套表面干污秽的存在对微波检测结果影响微弱,但是污秽受潮成为湿污秽后则会产生显著影响,微波检测反射信号强度的衰减程度与积污程度呈正相关。Microwave reflection is suitable for detecting internal defects of composite insulators due to its advantages of non-contact measurement and easy operation.In the process of detection,the condition of the composite insulator itself is also an important aspect that affects the detection results.This paper focuses on the influence of sheath thickness and surface pollution on the detection results using microwave reflection method.The study shows that the change of sheath thickness can significantly affect the microwave detection results.The intensity of microwave reflection signal varies with sheath thickness periodically.However,in actual composite insulators,the deviation of sheath thickness generally does not exceed 1.5 mm,and correspondingly,the change of microwave reflection signal intensity is limited to a certain range.Dry dirt on the surface of the sheath has a weak impact on the microwave detection results,while wet dirt has a significant impact.The attenuation degree of the microwave detection reflection signal strength is positively correlated with the degree of dirt accumulation.

关 键 词：护套厚度 表面污秽 微波 缺陷检测 复合绝缘子 

分 类 号：TM216[一般工业技术—材料科学与工程]