航天器多层隔热组件薄膜受力均匀性  

Stress uniformity of spacecraft multilayer thermal insulation components

作　　者：刘跃 索双富[2] 郭飞[2] 黄民[1] 孙巍伟[1] 谭博韬 黄首清[3] 李芳勇 LIU Yue;SUO Shuangfu;GUO Fei;HUANG Min;SUN Weiwei;TAN Botao;HUANG Shouqing;LI Fangyong(Ministry of Education Key Laboratory of Modern Measurement and Control Technology,Mechanical Electrical Engineering School,Beijing Information Science&Technology University,Beijing 100192,China;State Key Laboratory of Tribology,Department of Mechanical Engineering,Tsinghua University,Beijing 100084,China;Beijing Key Laboratory of Environment&Reliability Test Technology for Aerospace Mechanical&Electrical Products,Beijing Institute of Spacecraft Environment Engineering,Beijing 100094,China)

机构地区：[1]北京信息科技大学机电工程学院,现代测控技术教育部重点实验室,北京100192 [2]清华大学机械工程系,摩擦学国家重点实验室,北京100084 [3]北京卫星环境工程研究所,航天机电产品环境可靠性试验技术北京市重点实验室,北京100094

出　　处：《清华大学学报（自然科学版）》2023年第11期1868-1877,共10页Journal of Tsinghua University(Science and Technology)

基　　金：国家自然科学基金面上项目(52075043);北京信息科技大学科研基金项目(2023XJJ03)。

摘　　要：航天器在发射迅速泄压过程中,多层隔热组件的薄膜受力均匀与否是判断隔热组件是否失效的关键指标之一。在一定压差环境下,若每层隔热薄膜受力不均匀,则某一层薄膜会因承受较大流体压力而失效。该文以多层隔热组件受力均匀性指标展开研究,建立多层隔热组件三维切片模型,采用计算流体动力学(computational fluid dynamics, CFD)方法,分析了多层隔热组件在泄压过程中各级薄膜的受力情况;提出了薄膜压差系数,该系数是体现薄膜受力均匀性的关键指标;采用正交实验设计,分析了多项结构参数对薄膜压差系数的影响规律。结果表明:结构参数对薄膜压差系数的影响程度从大到小分别为薄膜孔直径、薄膜层数、错孔距离和薄膜厚度。该文提出了一种计算薄膜压差系数的数学解析方法,通过将该数学解析方法与CFD方法的计算结果进行对比分析,发现该方法更准确。该数学解析方法可用于快速计算多层隔热组件薄膜压差系数,为判断多层隔热组件薄膜在航天器发射过程中的受力均匀性提供依据,对避免多层隔热组件失效具有重要意义。[Objective]Multilayer thermal insulation components are key parts for thermal insulation and depressurization on the outer surface of a spacecraft,with the structure comprising primarily of multilayer thin films and nylon nets.However,during the process of spacecraft launch,the internal gas in the multilayer thermal insulation components rapidly flows out because of the rapid decrease in external pressure.Furthermore,the internal flow field changes considerably,resulting in the deformation of the multilayer thermal insulation components.Under certain pressure differential conditions,the stress on each thin film is nonuniform,and structural failure may occur on a certain thin film layer due to extreme stress.Thus,the stress uniformity of the multilayer thermal insulation components is a key indicator of structural failure.This paper proposes an evaluation indicator to assess the thin film stress uniformity of the multilayer thermal insulation components.[Methods]Three-dimensional slice models of the multilayer thermal insulation components are established,and the computational fluid dynamics method is adopted to analyze the internal flow field distribution and stress on each thin film during the depressurization process.Through the systematic analysis of the fluid pressure differential on each thin film,the thin film pressure differential coefficient is proposed as an evaluation indicator for stress uniformity.Furthermore,four typical structural parameters,namely the number of layers,thickness of the film,diameter of the hole,and distance of the hole,are selected within the extreme design range of various structural parameters of the multilayer thermal insulation components,and the orthogonal experimental design method is employed to analyze these structural parameters and determine the influence law of the structural parameters on the thin film pressure differential coefficient.Finally,a mathematical analytical model for calculating the thin film pressure differential coefficient is proposed based on the influenc

关 键 词：航天器 多层隔热组件 三维切片模型 流体动力学 薄膜压差系数 

分 类 号：TH136[机械工程—机械制造及自动化]