用于大规模量产射频开关芯片的谐波测试系统  

Harmonic Test System for Mass Production of Radio Frequency Switch Chips

作　　者：胡信伟 Hu Xin-wei(Shanghai Zhibai Intelligent Technology Co.,Ltd.,Shanghai 200333,China)

机构地区：[1]上海知白智能科技有限公司,上海200333

出　　处：《科学与信息化》2023年第21期85-88,共4页Technology and Information

摘　　要：本文介绍了一种应对量产自动测试机的大功率谐波测试系统的设计,该设计可以对绝大多数的射频前端开关芯片进行二次和三次谐波的测试。这种方法可以广泛地应用于半导体固态射频开关的量产FT测试和CP测试及实验室可靠性测试中。This paper introduces the design of a high-power harmonic test system for mass production of automatic test machine,the design can perform the second and third harmonic tests of most radio frequency front-end switch chips.This method can be widely used in mass production of FT testing and CP testing of semiconductor solid-state radio frequency switches and laboratory reliability testing.

关 键 词：谐波测试 固态开关 射频 天线调谐开关 

分 类 号：TM7[电气工程—电力系统及自动化]