仪表放大器参数特性分析与测试方法研究  

Analysis of Instrument Amplifier Parameter Characteristics and Research on Testing Methods

作　　者：何忠名 赵彦飞[1] 李明明 于望 刘江城 He Zhongming;Zhao Yanfei;Li Mingming;Yu Wang;Liu Jiangcheng(China Academy of Launch Vehicle Technology,Beijing,100076,China)

机构地区：[1]中国运载火箭技术研究院,北京100076

出　　处：《仪器仪表用户》2023年第12期104-108,82,共6页Instrumentation

摘　　要：仪表放大器在各个测量系统中均有着十分广泛的应用,对其进行测试和筛选能够有效地剔除其中的不合格品和早期失效产品,防止给系统造成进一步损失。目前仪表放大器暂无相应的测试标准,通常将其作为运算放大器接入运放环中进行测试,导致部分电性能参数难以测试和筛选。本文通过对仪表放大器的结构原理和参数特性进行分析研究后,提出了一种基于ATE与外接高精度数字多用表联合测试的方法。实验结果表明,该方法能够实现仪表放大器较为全面且高精度的测试,在元器件质量与可靠性保证方面具有良好的应用价值。Instrumentation amplifiers are widely used in various measurement systems.Testing and screening them can effectively eliminate unqualified products and early failure products to prevent further losses to the system.At present,there is no corresponding test standard for instrumentation amplifiers.It is usually regarded as an operational amplifier connected to an operational amplifier loop for testing,making it difficult to test and screen some electrical performance parameters.After analyzing and studying the structural principles and parameter characteristics of instrumentation amplifiers,this paper proposes a joint testing method based on ATE and an external high-precision digital multimeter.Experimental results show that this method can achieve more comprehensive and high-precision testing of instrumentation amplifiers,and has good application value in ensuring the quality and reliability of electronic components.

关 键 词：仪表放大器 参数特性 ATE 集成电路测试 

分 类 号：TN98[电子电信—信息与通信工程]