高空间分辨率LA-ICP-MS测定硅酸盐玻璃标准物质中42种微量元素  

Determination of 42 Trace Elements in Silicate Glass Reference Materials by High Spatial Resolution LA-ICP-MS

作　　者：何焘 张晨西 张文[1] 冯彦同 梁婷 邱晓云 曹慧 胡兆初[1] HE Tao;ZHANG Chenxi;ZHANG Wen;FENG Yantong;LIANG Ting;QIU Xiaoyun;CAO Hui;HU Zhaochu(State Key Laboratory of Geological Processes and Mineral Resources,China University of Geosciences(Wuhan),Wuhan 430074,China;Key Laboratory of Gold Mineralization Processes and Resources Utilization,Ministry of Natural Resources,Shandong Institute of Geological Sciences,Jinan 250013,China;School of Earth and Space Science,University of Science and Technology of China,Hefei 230026,China)

机构地区：[1]地质过程与矿产资源国家重点实验室,中国地质大学(武汉),湖北武汉430074 [2]自然资源部金成矿过程与资源利用重点实验室,山东省地质科学研究院,山东济南250013 [3]中国科学技术大学地球与空间科学学院,安徽合肥230026

出　　处：《岩矿测试》2023年第5期983-995,共13页Rock and Mineral Analysis

基　　金：国家重点研发计划项目(2021YFC2903000)课题“战略性矿产微区原位分析技术及应用”。

摘　　要：近年来,随着人们对关键金属(稀有金属、稀土金属、稀散金属和稀贵金属)的成矿机制、分布规律和绿色利用等研究日益加深,建立原位测定地质样品中关键金属元素(如REEs、Cr、Co、Ga、Ag、Cd、In、W、Tl等)分析方法对于研究关键金属元素的地球化学行为、分布规律和成矿机制具有重要意义。由于关键金属在地壳中丰度极低(一般为ng/g~μg/g级别),赋存矿物非常细小(粒径μm级别),因此需要建立高空间分辨率微区原位分析技术实现低含量(ng/g~μg/g)微量元素的定量。本文提出了高频剥蚀模式与Ar-N2等离子体技术相结合提升LA-ICP-MS对微量元素的检出能力,使之能够满足地质样品中关键金属元素的检测需求。结果表明:在Ar-N2等离子体条件下,采用高频(20Hz)剥蚀模式,LA-ICP-MS分析中大部分元素灵敏度提升了1.5~9倍。在使用高灵敏度X型截取锥时,高频剥蚀模式与氮气增敏技术相结合可以显著减小氧化物产率和降低U-Th分馏,获得更宽的载气流速区间(0.9~1.08L/min)以满足测试的仪器分析条件(ThO+/Th+<0.5%和U/Th=1)。本研究开发的高空间分辨率LA-ICP-MS关键金属分析方法具有较低的检出限(在剥蚀束斑24μm条件下,30种元素的检出限<0.02μg/g),在高空间分辨率(10~24μm)条件下,通过对8种国际硅酸盐玻璃标准物质中42种微量元素进行定量分析,34种微量元素的测试结果的准确度优于10%,精密度优于15%,实现了在高空间分辨率条件下对微量元素的准确定量分析。BACKGROUND:Critical metal elements are a group of metal elements including rare metal elements(e.g.,Li,Be,Rb,Cs,Nb,Ta,Zr,Hf,W),rare earth elements(REEs),rare disperse elements(e.g.,Ga,Ge,Se,Cd,In,Te,Re,Tl)and rare precious elements(e.g.,PGE,Cr and Co),which are important for the development of emerging industries.In recent years,the critical metal elements have shown great economic characteristics in emerging industries such as advanced materials,new energy resources and national defense and military industry uses,which is important strategic significance for the development of the national economy and technology.Therefore,it is necessary to investigate the geochemical properties and metallogenic mechanism of critical metal elements.How to accurately determine trace elements in geological materials is a prerequisite for these investigations.Critical metal elements in geological materials can be determined by conventional chemical wet digestion methods.However,chemical wet digestion methods can only obtain an average chemical composition without spatial distribution information of critical metal elements.Compared to digestion methods,in situ microanalysis technology can obtain micrometer scale elemental distribution in silicate minerals,omit tedious chemical processing processes and avoid the use of a large amount of chemical reagents.However,the abundance of critical metal elements in the crust is low(μg/g level)and the carrier minerals containing critical metal elements are at the micrometer scale.Therefore,it is necessary to establish a high spatial resolution in situ analysis technique to determine trace elements in geological materials.OBJECTIVES:To improve sensitivity of LA-ICP-MS for the determination of critical metal elements(ng/g-μg/g level)in silicate minerals by high-frequency ablation mode combined with Ar-N2 mixed plasma technique.METHODS:Experiments were carried out using a single collector ICP-MS(Element XR Thermo Fisher Scientific,Bremen,Germany)in combination with a 193nm excimer laser ablation

关 键 词：LA-ICP-MS 高空间分辨率 高频剥蚀 氮气增敏 关键金属 

分 类 号：O657.63[理学—分析化学] P599[理学—化学]