Defocused imaging-based quantification of plasmon-induced distortion of single emitter emission  

作　　者：Gwiyeong Moon Taehwang Son Hajun Yoo Changhun Lee Hyunwoong Lee Seongmin Im Donghyun Kim 

机构地区：[1]School of Electrical and Electronic Engineering,Yonsei University,Seoul 03722,Korea [2]LG Innotek,Seoul 07796,South Korea [3]Center for Systems Biology,Massachusetts General Hospital,Boston,MA,USA [4]LG Display,Paju,Gyeonggi-do 10845,South Korea

出　　处：《Light(Science & Applications)》2023年第10期2236-2247,共12页光（科学与应用)（英文版）

基　　金：supported by the National Research Foundation of Korea under Grant NRF-2022R1A4A2000748 and Y-BASE R&E Institute,a Brain Korea 21 four program,Yonsei University.

摘　　要：Optical properties of single emitters can be significantly improved through the interaction with plasmonic structures,leading to enhanced sensing and imaging capabilities.In turn,single emitters can act as sensitive probes of the local electromagnetic field surrounding plasmonic structures,furnishing fundamental insights into their physics and guiding the design of novel plasmonic devices.However,the interaction of emitters in the proximity to a plasmonic nanostructure causes distortion,which hinders precise estimation of position and polarization state and is one of the reasons why detection and quantification of molecular processes yet remain fundamentally challenging in this era of super-resolution.Here,we investigate axially defocused images of a single fluorescent emitter near metallic nanostructure,which encode emitter positions and can be acquired in the far-field with high sensitivity,while analyzing the images with pattern matching algorithm to explore emitter-localized surface plasmon interaction and retrieve information regarding emitter positions.Significant distortion in defocused images of fluorescent beads and quantum dots near nanostructure was observed and analyzed by pattern matching and finite-difference time-domain methods,which revealed that the distortion arises from the emitter interaction with nanostructure.Pattern matching algorithm was also adopted to estimate the lateral positions of a dipole that models an emitter utilizing the distorted defocused images and achieved improvement by more than 3 times over conventional diffraction-limited localization methods.The improvement by defocused imaging is expected to provide a way of enhancing reliability when using plasmonic nanostructure and diversifying strategies for various imaging and sensing modalities.

关 键 词：DISTORTION MATCHING interaction 

分 类 号：TB3[一般工业技术—材料科学与工程]